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首页> 外文期刊>Materials science in semiconductor processing >Influence of Mn doping on structural, optical and electrical properties of CdO thin films prepared by cost effective spray pyrolysis method
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Influence of Mn doping on structural, optical and electrical properties of CdO thin films prepared by cost effective spray pyrolysis method

机译:锰掺杂对高性价比喷雾热解法制备CdO薄膜结构,光学和电学性能的影响

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Transparent and conducting cadmium oxide (CdO) and manganese doped CdO (Mn: CdO) thin films were deposited using a low cost spray pyrolysis method on the glass substrate at 300℃. For Mn doping, various concentrations of manganese acetate (1-3 wt%) was used in the spraying precursor solution. The structural, electrical and optical properties of CdO and Mn: CdO films were investigated using X-ray diffraction (XRD), scanning electron microscope (SEM), atomic force microscope (AFM), UV-vis and Hall measurement. X-ray diffraction study reveals that the CdO and Mn: CdO films are possessing cubic crystal structures. SEM and AFM studies reveal that the grain size and roughness of the films are increased with increasing Mn doping concentration. Optical transmittance spectra of the CdO film decreases with increasing doping concentration of manganese. The optical band gap of the films decreases from 2.42 eV to 2.08 eV with increasing concentration of manganese. A minimum resistivity of 1.11 × 10~(-3) Ω cm and maximum mobility of 20.77 cm~2V~(-1) s~(-1) is achieved for 1 wt% of manganese doping.
机译:在300℃下,采用低成本喷雾热解法在玻璃基板上沉积透明导电的氧化镉(CdO)和掺杂锰的CdO(Mn:CdO)薄膜。对于Mn掺杂,在喷雾前体溶液中使用各种浓度的乙酸锰(1-3wt%)。使用X射线衍射(XRD),扫描电子显微镜(SEM),原子力显微镜(AFM),UV-vis和Hall测量研究了CdO和Mn:CdO膜的结构,电学和光学性质。 X射线衍射研究表明CdO和Mn:CdO薄膜具有立方晶体结构。 SEM和AFM研究表明,随着Mn掺杂浓度的增加,薄膜的晶粒尺寸和粗糙度也会增加。随着锰掺杂浓度的增加,CdO薄膜的光透射光谱降低。随着锰浓度的增加,薄膜的光学带隙从2.42 eV降低到2.08 eV。锰掺杂量为1 wt%时,最小电阻率为1.11×10〜(-3)Ωcm,最大迁移率为20.77 cm〜2V〜(-1)s〜(-1)。

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