Molecular weight determination of fluorocarbon end-capped polyester ultrathin films by X-ray photoelectron spectroscopy

Lee WK.; Gardella JA.; Toselli M.

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Molecular weight determination of fluorocarbon end-capped polyester ultrathin films by X-ray photoelectron spectroscopy

机译：X射线光电子能谱法测定碳氟封端聚酯超薄膜的分子量

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《Macromolecules》 |2001年第10期|共4页
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Lee WK.; Gardella JA.; Toselli M.;
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正文语种 eng
中图分类化学;有机化学;
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1. Molecular weight determination of fluorocarbon end-capped polyester ultrathin films by X-ray photoelectron spectroscopy [J] . Lee WK., Gardella JA., Toselli M. Macromolecules . 2001,第10期

机译：X射线光电子能谱法测定碳氟封端聚酯超薄膜的分子量
2. Determination of the Thickness of Ultrathin Films by X-ray Photoelectron Spectroscopy [J] . V. I. Nefedov, V. G. Yarzhemsky, I. S. Nefedova, Doklady. Physics . 2004,第5期

机译：X射线光电子能谱法测定超薄膜的厚度
3. Thickness determination of molecularly thin lubricant films by angle-dependent X-ray photoelectron spectroscopy [J] . Chongjun Pang, Mingwu Bai Applied Surface Science . 2007,第10期

机译：角度依赖性X射线光电子能谱法测定分子润滑膜的厚度
4. RATE-LIMITING STEP OF SiO_2 ETCHING REACTION IN FLUOROCARBON PLASMA INVESTIGATED BY ELECTRON SPIN RESONANCE AND X-RAY PHOTOELECTRON SPECTROSCOPY [C] . Mitsuru Okigawa, Miyako Matsui, Tetsuya Tatsumi, Symposium on Plasma Etching Processes for Sub-Quarter Micron Devices Oct 17-22, 1999, Honolulu, HI . 1999

机译：电子自旋共振和X射线光电子能谱研究氟碳等离子体中SiO_2刻蚀反应的限速步骤
5. Preparation and Detailed X-Ray Photoelectron Spectroscopy and Spectroscopic Ellipsometry Analysis of Ultrathin Protective Coatings [D] . Johnson, Brian Ivins. 2019

机译：超薄保护涂层的制备及X射线光电子能谱和光谱椭圆形分析
6. Growthof an Ultrathin Zirconia Film on Pt3Zr Examined by High-ResolutionX-ray Photoelectron SpectroscopyTemperature-Programmed Desorption Scanning Tunneling Microscopyand Density Functional Theory [O] . Hao Li, Joong-Il Jake Choi, Wernfried Mayr-Schmölzer, -1

机译：成长性高分辨率检查Pt3Zr上超薄氧化锆膜的制备X射线光电子能谱程序升温解吸扫描隧道显微镜和密度泛函理论
7. Determination of Lithium-Ion Distributions in Nanostructured Block Polymer Electrolyte Thin Films by X-ray Photoelectron Spectroscopy Depth Profiling [O] . Gilbert Jonathan B., Luo Ming, Shelton Cameron K., 2014

机译：用X射线光电子能谱深度分析测定纳米结构嵌段聚合物电解质薄膜中的锂离子分布

Molecular weight determination of fluorocarbon end-capped polyester ultrathin films by X-ray photoelectron spectroscopy

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