Investigation of Switching Behaviour in PbZr_(0.55)Ti_(0.45)O_3 Thin Films by Means of Scanning Probe Microscopy

摘要

Polarization switching processes in polycrystalline PbZr_(0.55)Ti_(0.45)O_3 thin films were investigated using piezoresponse mode of Scanning Probe Microscopy. Analysis of a piezoresponse signal reveals self-polarization of as-grown film caused by internal bias field. The written domains with polarization oriented opposite to self-polarization direction are unstable and switched back with time. The dynamics of backswitching process strongly depends on the films microstructure and is slower in the regions with higher density of grain boundaries.