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International Metallographic Society Annual meeting;Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting

召开年：2011
召开地：Nashville, TN(US)
出版时间：-

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1.High-Content Imaging to Profile Cellular and Pathogen Responses to Bioactive Probes

机译：高内涵成像可描述细胞和病原体对生物活性探针的反应
- 作者：R.G. Panchal; K. Kota; D. Lane; Brett Eaton; S. Bavari
- 会议名称：《International Metallographic Society Annual meeting;Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting》 | 2011年
2.Line Defects at Interfaces in Telluride-Based Thermoelectric Materials

机译：碲化物基热电材料界面处的线缺陷
- 作者：D.L. Medlin; J.D. Sugar; N.Heinz; T. Ikeda; G.J. Snyder
- 会议名称：《International Metallographic Society Annual meeting;Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting》 | 2011年
3.Challenges of Working with Active Pharmaceutical Ingredients to Measure Adhesion Forces by Atomic Force Microscopy

机译：使用活性药物成分通过原子力显微镜测量粘附力的挑战
- 作者：A.D. Vogt; J.C. Reddel
- 会议名称：《International Metallographic Society Annual meeting;Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting》 | 2011年
4.In Situ TEM Investigation of Electrical Current Effect on Aluminum Interconnect

机译：电流对铝互连件电流影响的原位TEM研究
- 作者：Degang Xie; Zhiwei Shan
- 会议名称：《International Metallographic Society Annual meeting;Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting》 | 2011年
5.Chemical Imaging of Direct Compression Pharmaceutical Formulations

机译：直接压缩药物制剂的化学成像
- 作者：J.P. Neilly; A.D. Vogt; M.J. Pheil; T.S. McDermott
- 会议名称：《International Metallographic Society Annual meeting;Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting》 | 2011年
6.Identification and Local Chemical Analysis of Pharmaceutical Impurities

机译：药物杂质的鉴定和局部化学分析
- 作者：T.L. Nylese; R.A. Anderhalt; U. Patel
- 会议名称：《International Metallographic Society Annual meeting;Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting》 | 2011年
7.X-ray Tomography Generates Quantitative, 3-D Views of Intact Cells

机译：X射线断层扫描可生成完整细胞的定量3D视图
- 作者：M. Uchida; C. Knoechel; G. McDermott; M. Wetzler; A. Barron; M.A. Le Gros; C.A. Larabell
- 会议名称：《International Metallographic Society Annual meeting;Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting》 | 2011年
8.30 Years of Transmission Electron Microscopy (TEM) at the Wyoming State Veterinary Laboratory, Laramie, WY as an Aid for Virus Diagnosis

机译：怀俄明州兽医实验室，怀俄明州拉勒米市的透射电子显微镜（TEM）已有30年历史，可用于病毒诊断
- 作者：C.E. Hearne; J.C. Cavender; M.M. Miller
- 会议名称：《International Metallographic Society Annual meeting;Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting》 | 2011年
9.Ethylene and Structure-Function Relations of Xylella fastidiosa in Vitis vinifera in Pierce’s Disease in Plants

机译：植物皮尔斯病中葡萄中的小叶小球藻的乙烯与结构-功能关系
- 作者：E. Ann Ellis; B. Greg Cobb
- 会议名称：《International Metallographic Society Annual meeting;Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting》 | 2011年
10.Characterization of Semiconductor Nanospikes Produced by Focused Ion Beam Erosion

机译：聚焦离子束腐蚀产生的半导体纳米钉的表征
- 作者：K.A. Grossklaus; J.M. Millunchick
- 会议名称：《International Metallographic Society Annual meeting;Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting》 | 2011年
11.New Generalized Method for the TEM Examination of Buried Interfaces with Application to the Copper Bond Wire - Aluminum Pad System

机译：埋入式界面TEM检测的新通用方法及其在铜键合线-铝垫系统中的应用
- 作者：B. Tracy; A. delRosario; M. Sidorov; S. Li; F. Classe; J.C. Yeoh; S. Gaddamraja
- 会议名称：《International Metallographic Society Annual meeting;Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting》 | 2011年
12.Development of a Cryo-Air Protection Holder for FIB/(S)TEM

机译：开发用于FIB /（S）TEM的低温空气保护支架
- 作者：Y. Kuroda; M. Kudo; A. Morikawa; T. Sato; T. Iwahori; T. Agemura
- 会议名称：《International Metallographic Society Annual meeting;Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting》 | 2011年
13.A New Method to Fabricate 3D Electron Tomography Sample Using FIB Technique

机译：利用FIB技术制造3D电子断层扫描样品的新方法
- 作者：Xiongyao Wang; Ross Lockwood; Doug Vick; Al Meldrum; Marek Malac
- 会议名称：《International Metallographic Society Annual meeting;Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting》 | 2011年
14.Realization of the First Aplanatic Transmission Electron Microscope

机译：第一个非平面透射电子显微镜的实现
- 作者：I. Maβmann; S. Uhlemann; H. Müller; P. Hartel; J. Zach; M. Haider; Y. Taniguchi; D. Hoyle; R. Herring
- 会议名称：《International Metallographic Society Annual meeting;Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting》 | 2011年
15.From Early Days of Cold Field-Emission Electron Gun at Hitachi to Sub-? Holography

机译：从日立冷场发射电子枪的早期发展到次级？全息摄影
- 作者：Akira Tonomura
- 会议名称：《International Metallographic Society Annual meeting;Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting》 | 2011年
16.DNA Sequencing by Electron Microscopy

机译：电子显微镜DNA测序
- 作者：A.L. Bleloch; C.S. Own; M. Hamalainen; J. Hershleb; K. Kemmish; R. Koene; H. Stark; J. Stark; M.Andregg; W. Andregg
- 会议名称：《International Metallographic Society Annual meeting;Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting》 | 2011年
17.Single-Atom Sensitive Chemical and Structural STEM Characterisation of Two-Dimensional MoS_2 Nano-Catalysts

机译：二维MoS_2纳米催化剂的单原子敏感化学和结构STEM表征
- 作者：Q.M. Ramasse; L.P. Hansen; M. Brorson; E. Johnson; B. Schaffer; C. Kisielowski; S. Helveg
- 会议名称：《International Metallographic Society Annual meeting;Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting》 | 2011年
18.Seeing the Atoms ??ore Clearly: STEM Imaging from the Crewe Era to Today

机译：清晰地看到原子矿石：从克鲁时代到今天的STEM成像
- 作者：S.J. Pennycook
- 会议名称：《International Metallographic Society Annual meeting;Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting》 | 2011年
19.Direct Imaging of Hydrogen Atoms in a Crystal by Annular Bright-Field STEM

机译：环形明场STEM对晶体中氢原子的直接成像
- 作者：E. Abe; R. Ishikawa; E. Okunishi; H. Sawada; Y. Kondo; F. Hosokawa
- 会议名称：《International Metallographic Society Annual meeting;Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting》 | 2011年
20.Efficient Elastic Imaging of Single Atoms with Aberration-Corrected Scanning Transmission Electron Microscopy

机译：像差校正扫描透射电子显微镜对单原子的高效弹性成像
- 作者：Robert Hovden; David A. Muller
- 会议名称：《International Metallographic Society Annual meeting;Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting》 | 2011年
21.Atomic-Resolution Differential Phase Contrast Imaging by STEM

机译：STEM的原子分辨率微分相差成像
- 作者：N. Shibata; S.D. Findlay; Y. Ikuhara
- 会议名称：《International Metallographic Society Annual meeting;Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting》 | 2011年
22.Atomic-scale Interaction Dynamics in Few-layer Hexagonal Boron Nitride (h-BN)

机译：几层六方氮化硼（h-BN）中的原子尺度相互作用动力学。
- 作者：Nasim Alem; Quentin Ramasse; Michael Sarahan; Rolf Erni; Oleg V. Yazyev; Kris Erickson ; Steven G. Louie; Alex Zettl
- 会议名称：《International Metallographic Society Annual meeting;Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting》 | 2011年
23.Picometer Transmission Electron Microscopy

机译：皮克计透射电子显微镜
- 作者：K. W. Urban
- 会议名称：《International Metallographic Society Annual meeting;Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting》 | 2011年
24.Probing Interfaces Using a Combination of Scanning Transmission Electron Microscopy and Density-Functional Theory

机译：结合扫描透射电镜和密度泛函理论探测界面
- 作者：S. T. Pantelides; T. J. Pennycook; W. Luo; M. P. Prange; H. N. Lee; M. P. Ox-ley; J. Garcia-Barriocanal; F. Y. Bruno; C. Leon; J. Santam aria; M. F. Chi-sholm; M. Varela; S. J. Pennycook
- 会议名称：《International Metallographic Society Annual meeting;Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting》 | 2011年
25.Aberration-Corrected STEM Imaging and Spectroscopy of Single-Layered Materials

机译：单层材料的像差校正STEM成像和光谱
- 作者：M.F. Chisholm;G. Duscher;W. Windl
- 会议名称：《》 | 2011年
26.Low kV Analysis and First Principles Study of the Structure and Bonding at SrTiO_3/GaAs Hetero-interfaces

机译：SrTiO_3 / GaAs异质界面结构和键合的低kV分析和第一性原理研究
- 作者：Q. Qiao; R.F. Klie; S. Ogut
- 会议名称：《International Metallographic Society Annual meeting;Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting》 | 2011年
27.Quantitative Composition Measurements of Atomic Columns Using STEM; Application to L1_2 Precipitates

机译：使用STEM的原子柱定量组成测量；适用于L1_2沉淀
- 作者：C Ophus; A Gautam; E Marquis; U Dahmen; V Radmilovic
- 会议名称：《International Metallographic Society Annual meeting;Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting》 | 2011年
28.Structure and Energy of Equilibrated Ni-Al_2O_3 Interfaces

机译：Ni-Al_2O_3平衡界面的结构和能量
- 作者：H. Meltzman; W.D. Kaplan
- 会议名称：《International Metallographic Society Annual meeting;Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting》 | 2011年
29.Atomic Resolution at 50 - 300 kV Obtained Using Low Dose Rate HRTEM

机译：使用低剂量率HRTEM获得的50-300 kV原子分辨率
- 作者：B. Barton; C. Song; C. Kisielowski
- 会议名称：《International Metallographic Society Annual meeting;Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting》 | 2011年
30.The Role of γ-Al_2O_3 Single Crystal Support to Pt Nanoparticles Construction

机译：γ-Al_2O_3单晶载体在Pt纳米颗粒构建中的作用
- 作者：Zhongfan Zhang; Long Li; Lin-lin Wang; Sergio I. Sanchez; Qi Wang; Duane D. Johnson; Anatoly I. Frenkel; Ralph G. Nuzzo; Judith C. Yang
- 会议名称：《International Metallographic Society Annual meeting;Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting》 | 2011年
31.Observation of Defects of CuInSe_2 by 300 kV Aberration Corrected Scanning Transmission Electron Microscope

机译：用300 kV像差校正扫描透射电子显微镜观察CuInSe_2的缺陷
- 作者：T. Tanaka; A. Takeshita; T. Kubota; Y. Oshima; Y. Tanishiro; K. Takayanagi
- 会议名称：《International Metallographic Society Annual meeting;Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting》 | 2011年
32.Interface and Structural Characterization of Buried CoSi_2/Si(001) Nanoplatelets

机译：CoSi_2 / Si（001）埋藏纳米片的界面和结构表征
- 作者：L.A. Montoro; A. Isaac; L.J. Giovanetti; F.G. Requejo; A.J. Ramirez
- 会议名称：《International Metallographic Society Annual meeting;Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting》 | 2011年
33.Challenges in Imaging Single Atoms Adsorbed or Embedded on Surfaces

机译：对吸附或嵌入表面的单个原子成像的挑战
- 作者：Jingyue (Jimmy) Liu; Lawrence F. Allard
- 会议名称：《International Metallographic Society Annual meeting;Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting》 | 2011年
34.Quantitative Annular Dark Field Images of Silicon (001) Crystal

机译：硅（001）晶体的定量环形暗场图像
- 作者：Y. Oshima; S. Kim; Y. Tanishiro; K. Takayanagi
- 会议名称：《International Metallographic Society Annual meeting;Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting》 | 2011年
35.Counting Tm Dopant Atoms in and Around GaN Dots Using Scannning Transmission Electron Microscopy

机译：使用扫描透射电子显微镜对GaN点及其周围的Tm掺杂原子进行计数
- 作者：J.L. Rouviere; H. Okuno; P.H. Jouneau; P. Bayle-Guillemaud; B. Daudin
- 会议名称：《International Metallographic Society Annual meeting;Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting》 | 2011年
36.Use of Aberration-Corrected STEM for Direct Structure and Chemistry Analysis of Catalytic Metal Particles

机译：像差校正STEM用于催化金属颗粒的直接结构和化学分析
- 作者：W. Sinkler; S. A. Bradley; L. F. Allard; P. M. Voyles
- 会议名称：《International Metallographic Society Annual meeting;Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting》 | 2011年
37.Vortex Beams for Atomic Resolution Dichroism

机译：涡旋光束用于原子分辨二色性
- 作者：J.C. Idrobo; S. J. Pennycook
- 会议名称：《International Metallographic Society Annual meeting;Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting》 | 2011年
38.Nanoparticle Movement: Plasmonic Forces and Physical Constraints

机译：纳米粒子的运动：等离子体张力和物理约束
- 作者：P.E. Batson; A. Reyes-Coronado; R.G. Barrera; A. Rivacoba; P.M. Echenique; J.Aizpurua
- 会议名称：《International Metallographic Society Annual meeting;Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting》 | 2011年
39.Atomic Resolved Secondary Electron Imaging with an Aberration Corrected Scanning Transmission Electron Microscope

机译：像差校正扫描透射电子显微镜的原子分辨二次电子成像
- 作者：H. Inada; K. Tamura; K. Nakamura; Y. Suzuki; M. Konno; D. Su; J. Wall; R. Egerton; Y. Zhu
- 会议名称：《International Metallographic Society Annual meeting;Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting》 | 2011年
40.Channeling Contrast in Sub-?ngstr?m Resolution High-Angle Annular Dark-Field Images of Planar Interfaces

机译：平面界面亚分辨率高分辨率高角度环形暗场图像中的通道对比度
- 作者：Jingyue (Jimmy) Liu; Lawrence F. Allard
- 会议名称：《International Metallographic Society Annual meeting;Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting》 | 2011年
41.Usual and Unusual Effects in ADF-STEM Imaging of Dopant Atom in Crystals

机译：晶体中掺杂原子的ADF-STEM成像中的常态和异常效应
- 作者：Anudha Mittal; Aloysius A. Gunawan; K. Andre Mkhoyan
- 会议名称：《International Metallographic Society Annual meeting;Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting》 | 2011年
42.Novel Multivariate Statistical Analysis Methods for STEM/EELS

机译：STEM / EELS的新型多元统计分析方法
- 作者：M.C. Sarahan; F. de la Pena; Q.M. Ramasse; M. Walls
- 会议名称：《International Metallographic Society Annual meeting;Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting》 | 2011年
43.Auto-Tuning of Aberrations Using High-Resolution STEM Images by Auto-Correlation Function

机译：通过自动相关功能使用高分辨率STEM图像自动调整像差
- 作者：H. Sawada; M. Watanabe; E. Okunishi; Y. Kondo
- 会议名称：《International Metallographic Society Annual meeting;Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting》 | 2011年
44.Coherent Electron Interference ofa Split HOLZ Line from a Strained Silicon Crystal

机译：应变硅晶体分裂的HOLZ线的相干电子干扰
- 作者：Rodney A. Herring; Koh Saitoh; Nobuo Tanaka; Takayoshi Tanji
- 会议名称：《International Metallographic Society Annual meeting;Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting》 | 2011年
45.Electron Beams with Orbital Angular Momentum

机译：具有轨道角动量的电子束
- 作者：Benjamin J. McMorran; Amit Agrawal; Ian M. Anderson; Andrew Herzing; Henri J. Lezec; Jabez J. McClelland; John Unguris
- 会议名称：《International Metallographic Society Annual meeting;Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting》 | 2011年
46.Prospects for Off-Axis Electron Holography in the TEAM I Microscope

机译：TEAM I显微镜中轴外电子全息术的前景
- 作者：M. Linck; T. Duden; U. Dahmen
- 会议名称：《International Metallographic Society Annual meeting;Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting》 | 2011年
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48.Reflections on Microscopy & Analysis: From Viewing the Small World to Leading on a Larger Stage

机译：显微镜与分析的思考：从观察小世界到更大视野
- 作者：DB Williams
- 会议名称：《International Metallographic Society Annual meeting;Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting》 | 2011年
49.Advanced Window Grids for Work at the Intersection of Electron and Optical Imaging

机译：在电子和光学成像交叉口工作的高级窗口网格
- 作者：C.C. Striemer; T.R. Gaborski
- 会议名称：《International Metallographic Society Annual meeting;Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting》 | 2011年
50.Chicago Exploration Days

机译：芝加哥探索日
- 作者：E. Zeitler
- 会议名称：《International Metallographic Society Annual meeting;Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting》 | 2011年
51.Characterizing a Liquid Repellent Nano-Coating Using a Multi-Technique Approach

机译：使用多种技术表征拒液纳米涂层
- 作者：T. S. Nunney; P. Mack; O. Greenwood; R. G. White; M. H. Wall; B. R. Strohmeier; S. Coulson; D. Evans
- 会议名称：《International Metallographic Society Annual meeting;Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting》 | 2011年
52.Chicago Aberration Correction Work

机译：芝加哥像差校正工作
- 作者：V.D.Beck
- 会议名称：《International Metallographic Society Annual meeting;Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting》 | 2011年
53.Endothelial Cell Culture Model (ECCM) for Evaluation of Aortic Endothelial Cells Exposed to Normal and Disturbed Flow

机译：内皮细胞培养模型（ECCM）用于评估主动脉内皮细胞暴露于正常流量和扰动流量
- 作者：R. Estrada; G. Giridharan; S. D. Prabhu; P. Sethu
- 会议名称：《International Metallographic Society Annual meeting;Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting》 | 2011年
54.Microtechnologies for Studying Cell Biology in Physiologically-Relevant Microenvironments

机译：在生理相关的微环境中研究细胞生物学的微技术
- 作者：C.A. Simmons
- 会议名称：《International Metallographic Society Annual meeting;Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting》 | 2011年
55.Combining Microfluidic Secretion Sampling with Small-Volume Proximity Immunoassays: Application to Murine Islets and Adipocytes

机译：结合微流控分泌采样与小批量邻近免疫测定：在小鼠胰岛和脂肪细胞中的应用
- 作者：Joonyul Kim; Leah A. Godwin; Kennon S. Deal; Zac Keenum; Desiree Wanders; Robert L.Judd; Christopher J. Easley
- 会议名称：《International Metallographic Society Annual meeting;Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting》 | 2011年
56.3D Imaging of Biological Cells Using a CryoFIB/SEM and a CryoTEM

机译：使用冷冻FIB / SEM和冷冻EM对生物细胞进行3D成像
- 作者：Korrinn Strunk; Trevor Clark; Jennifer L. Gray; Peijun Zhang
- 会议名称：《International Metallographic Society Annual meeting;Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting》 | 2011年
57.Electron Tomography of Quantum Dot Bioconjugates

机译：量子点生物共轭物的电子断层扫描
- 作者：A.M. Courtis; R. Mazitschek; D.C. Bell
- 会议名称：《International Metallographic Society Annual meeting;Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting》 | 2011年
58.3D Characterization of Nano-Pipes and Nano-Pores in Hematite Particles

机译：赤铁矿颗粒中的纳米管和纳米孔的3D表征
- 作者：Niven Monsegue; Takuya Echigo; Deepak Bharkhada; Ge Wang; Mitsuhiro Murayama
- 会议名称：《International Metallographic Society Annual meeting;Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting》 | 2011年
59.Gold Nanoparticles: 3D-STEM-HAADF Analyses and Plasmonic Studies by EELS

机译：金纳米颗粒：EELS进行的3D-STEM-HAADF分析和等离子研究
- 作者：R. Arenal; L. Roiban; O. Ersen; J. Burgin; M. Treger-Delapierre
- 会议名称：《International Metallographic Society Annual meeting;Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting》 | 2011年
60.3D STEM for Imaging Biological Samples and Nanoparticles

机译：用于生物样品和纳米颗粒成像的3D STEM
- 作者：A.R. Lupini; S. J. Pennycook; N. de Jonge
- 会议名称：《International Metallographic Society Annual meeting;Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting》 | 2011年
61.STEM Axial Resolution Calculated by Monte Carlo Simulations in Micrometers- Thick Substrates

机译：通过蒙特卡洛模拟在微米厚的基底中计算出的STEM轴向分辨率
- 作者：H. Demers; D. Drouin; N. de Jonge
- 会议名称：《International Metallographic Society Annual meeting;Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting》 | 2011年
62.Optimized Tomographic Acquisition and Reconstruction for Highly Faceted Nanostructures with Isotropic Resolution

机译：具有各向同性分辨率的高度多面纳米结构的最佳层析成像采集和重建
- 作者：P. Ercius
- 会议名称：《International Metallographic Society Annual meeting;Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting》 | 2011年
63.A New Approach to Electron Tomography for The ATOM Project

机译：ATOM项目电子断层扫描的新方法
- 作者：T. Petersen; M.K. Miller; T.K Kelly; K. Rajan; S.P. Ringer
- 会议名称：《International Metallographic Society Annual meeting;Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting》 | 2011年
64.The Tri-Beam System: Femtosecond Laser Based Tomography in a Dual-Beam FIB

机译：三光束系统：双光束FIB中基于飞秒激光的层析成像
- 作者：M.P. Echlin; A. Mottura; T.M. Pollock
- 会议名称：《International Metallographic Society Annual meeting;Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting》 | 2011年
65.3D EDX Microanalysis by FIB-SEM: Enhancement of Elemental Quantification

机译：通过FIB-SEM进行3D EDX微量分析：元素定量的增强
- 作者：P. Burdet; C. Hebert; M. Cantoni
- 会议名称：《International Metallographic Society Annual meeting;Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting》 | 2011年
66.Quantifying Dispersion in Polymer Systems by Combining Image Analysis and Statistical Analysis

机译：结合图像分析和统计分析量化聚合物系统中的分散度
- 作者：Olivier Guise; Carl Strom
- 会议名称：《International Metallographic Society Annual meeting;Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting》 | 2011年
67.Electron Beam Induced Radiation Damage in Nafion and the Lifetime of Fuel Cells

机译：Nafion中电子束引起的辐射损伤和燃料电池的寿命
- 作者：Qianping He; David C. Joy; David J. Keffer
- 会议名称：《International Metallographic Society Annual meeting;Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting》 | 2011年
68.Old Dogs and New Tricks: Adapting Existing Analytical E-Beam Equipment for Automated Large-Area Quantitative Elemental Mapping of Chlorine in Cement, Mortar and Concrete

机译：老狗和新技术：改造现有的分析型电子束设备，以自动进行水泥，砂浆和混凝土中氯的大面积定量元素映射
- 作者：B.J. Willenberg; R.A. Deist; L.A. Dempere
- 会议名称：《International Metallographic Society Annual meeting;Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting》 | 2011年
69.Nanoscale Building Material Characterization by Means of High-Resolution SEM Imaging Techniques

机译：高分辨率SEM成像技术表征纳米级建筑材料
- 作者：B. E. Möser
- 会议名称：《International Metallographic Society Annual meeting;Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting》 | 2011年
70.Three Dimensional Chemical Mapping of Fly Ash

机译：粉煤灰的三维化学映射
- 作者：Quinang Hua; Robert Frazier; Tyler Ley; Jay Hanan; Jeff Davis
- 会议名称：《International Metallographic Society Annual meeting;Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting》 | 2011年
71.Limiting Freeze/Thaw Damage in Cementitious Infrastructure Systems with Phase Change Materials (PCMs)

机译：使用相变材料（PCM）限制水泥基础设施系统的冻融破坏
- 作者：A.R. Sakulich; D.P. Bentz
- 会议名称：《International Metallographic Society Annual meeting;Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting》 | 2011年
72.Imaging and Spectroscopy of Carbon Nanostructures with 80 and 20 keV Electrons

机译：具有80和20 keV电子的碳纳米结构的成像和光谱学
- 作者：U. A. Kaiser
- 会议名称：《International Metallographic Society Annual meeting;Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting》 | 2011年
73.Complimentary Chemical Imaging of Au-Nanoparticles Embedded in MgO using Laser Assisted Atom Probe Tomography

机译：使用激光辅助原子探针层析成像技术对嵌入MgO中的金纳米颗粒进行化学补充成像
- 作者：S.V.N.T. Kuchibhatla; V. Shutthanandan; B.W. Arey; T. J. Prosa; P. Adusumilli; R. M. Ulfig; C.M. Wang; S. Thevuthasan
- 会议名称：《International Metallographic Society Annual meeting;Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting》 | 2011年
74.Non-Tangential Continuity Reconstruction in Atom Probe Tomography Data

机译：原子探针断层扫描数据中的非相切连续性重建
- 作者：D.J. Larson; B.P. Geiser; T.J. Prosa; R.M. Ulfig; T.F. Kelly
- 会议名称：《International Metallographic Society Annual meeting;Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting》 | 2011年
75.Analysis of Laser Influence on Field Enhancement and Heating of the Specimen in Pulsed Laser Atom Probe Tomography

机译：激光对脉冲激光原子探针层析成像中样品场增强和加热的影响分析
- 作者：X. Chen; C. J. Tourek; X.Wang; S. Sundararajan
- 会议名称：《International Metallographic Society Annual meeting;Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting》 | 2011年
76.Analysis of Ion Evaporation Events through Data Mining: An Experimental Foundation for Interpreting Chemical Imaging in the Atomscope

机译：通过数据挖掘分析离子蒸发事件：解释原子镜中化学成像的实验基础
- 作者：S.R. Broderick; K. Kaluskar; M.K Miller; S.P. Ringer; T.F. Kelly; K. Rajan
- 会议名称：《International Metallographic Society Annual meeting;Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting》 | 2011年
77.Kinetic-Energy Discrimination for Atom Probe Tomography: Concepts and Potential Detectors

机译：原子探针层析成像的动能鉴别：概念和潜在检测器。
- 作者：Thomas F. Kelly
- 会议名称：《International Metallographic Society Annual meeting;Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting》 | 2011年
78.Prospects for Atom Probe Tomography of Commercial Semiconductor Devices

机译：商用半导体器件的原子探针层析成像技术的前景。
- 作者：D.J. Larson; D. Lawrence; D. Olson; T.J. Prosa; D.A. Reinhard; R.M. Ulfig; P.H. Clifton; J.H. Bunton; D. Lenz; J.D. Olson; L. Renaud; Martin; T.F. Kelly
- 会议名称：《International Metallographic Society Annual meeting;Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting》 | 2011年
79.Measuring Contributions to Mass Resolving Power in Atom Probe Tomography

机译：测量对原子探针层析成像质量分辨能力的贡献
- 作者：E. Oltman; T.F. Kelly; T.J. Prosa; D. Lawrence; D.J. Larson
- 会议名称：《International Metallographic Society Annual meeting;Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting》 | 2011年
80.New Equipment for Correlative FIB/TEM/Atom Probe and Site-Specific Preparation Using STEM Live Imaging

机译：新型FIB / TEM / Atom探针相关设备和使用STEM实时成像进行特定部位制备的设备
- 作者：P. Felfer; J. M. Cairney
- 会议名称：《International Metallographic Society Annual meeting;Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting》 | 2011年
81.Evaluation of Defect Structures from In Situ Dielectric Breakdown of SiO_2-Based Gate Dielectric Layers

机译：基于SiO_2基栅介电层的原位介电击穿评估缺陷结构
- 作者：C.S. Bonifacio; K. van Benthem
- 会议名称：《International Metallographic Society Annual meeting;Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting》 | 2011年
82.In-Situ Cross-Sectional Switching of Multiferroic BiFeO3 Thin Films

机译：多铁性BiFeO3薄膜的原位截面转换
- 作者：C.T. Nelson; P. Gao; J. Jokisaari; B. Winchester; Y. Gu; C. Heikes; A. Melville; C.Adamo; S.H. Baek; C. . Folkman; C.B. Eom; D.G. Schlom; L.Q. Chen; X.Q. Pan
- 会议名称：《International Metallographic Society Annual meeting;Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting》 | 2011年
83.In situ TEM Studies of Ferroelectric Thin Films

机译：铁电薄膜的原位透射电镜研究
- 作者：P. Gao; C. T. Nelson; J. R. Jokisaari; S.H. Baek; C. B.Eom; E. G. Wang; X. Q. Pan
- 会议名称：《International Metallographic Society Annual meeting;Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting》 | 2011年
84.Electron Microscopy of Ferroelectric Domain Switching in PbZr_(0.2)Ti_(0.8)O_3 Thin Films

机译：PbZr_（0.2）Ti_（0.8）O_3薄膜中铁电畴转换的电子显微镜观察
- 作者：M.-G. Han; M. A. Schofield; L. Wu; C. Ma; J. Pulecio; J. Hoffman; F. Walker; C.Ahn; Y. Zhu
- 会议名称：《International Metallographic Society Annual meeting;Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting》 | 2011年
85.Quantitative Analysis of Chemical Compositionusing HAADF-STEM in a JEOL 2200FS

机译：在JEOL 2200FS中使用HAADF-STEM对化学成分进行定量分析
- 作者：R. Fritz; A. Beyer; W. Stolz; K. Mueller; M. Schowalter; A. Rosenauer; I. Häusler; A. Mogliatenko; H. Kirmse; W. Neumann; K. Volz
- 会议名称：《International Metallographic Society Annual meeting;Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting》 | 2011年
86.Interplay Between Polarization and Oxygen Stoichiometry at Ferroelectric Domain Boundaries in BiFeO_3

机译：BiFeO_3中铁电畴边界的极化和氧化学计量之间的相互作用
- 作者：A.Y. Borisevich; J. Seidel; R. Ramesh; S.J. Pennycook
- 会议名称：《International Metallographic Society Annual meeting;Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting》 | 2011年
87.The Structure of He-Irradiated Gold Twist Boundary

机译：氦辐照金扭曲边界的结构
- 作者：S. Dey; N. D. Browning
- 会议名称：《International Metallographic Society Annual meeting;Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting》 | 2011年
88.Detection of a Structural Unit in a [001]45° Tilt Quasi-Periodic Grain Boundary of Al by Doubly Diffracted Electron Diffraction Pattern

机译：用双衍射电子衍射图检测Al的[001] 45°倾斜准周期性晶界中的结构单元
- 作者：M. Shamsuzzoha
- 会议名称：《International Metallographic Society Annual meeting;Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting》 | 2011年
89.Exact Solutions for Power-Law Fluid of a Generalized Oldroyd-B Fluid with Oscillating Boundary Conditions

机译：具有振荡边界条件的广义Oldroyd-B流体的幂律流体的精确解
- 作者：Y.Q. Liu; L.C. Zheng; X.X. Zhang
- 会议名称：《International Metallographic Society Annual meeting;Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting》 | 2011年
90.Resolving Atomic Scale Interfacial Chemical Changes in ODS Ferritic Alloys

机译：解决ODS铁素体合金中的原子尺度界面化学变化
- 作者：J. Aguiar; L. Hsiung; P. Hosemann; M. Fluss; N.D. Browning
- 会议名称：《International Metallographic Society Annual meeting;Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting》 | 2011年
91.Synthesis, Structure, and Morphology of Magnetic Core-Shell Nanoparticles

机译：磁性核壳纳米粒子的合成，结构和形貌
- 作者：E.C. Mattson; E.S. Krystofiak; P.M. Voyles; C.J. Hirschmugl; M. Gajdardziska-Josifovska; J.A. Oliver
- 会议名称：《International Metallographic Society Annual meeting;Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting》 | 2011年
92.Results on 20 kV Spectroscopy with Monochromation and In-Column Filter

机译：带有单色和柱内过滤器的20 kV光谱结果
- 作者：S. Pokrant; A. Orchowski; G. Benner; M. Cheynet; U. Kaiser
- 会议名称：《International Metallographic Society Annual meeting;Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting》 | 2011年
93.
- 会议名称：《》
94.3D Confocal Raman Imaging of Transparent and Opaque Samples

机译：透明和不透明样品的3D共焦拉曼成像
- 作者：U. Schmidt; J. Yang; W. Liu; A. Jauss; T. Dieing
- 会议名称：《International Metallographic Society Annual meeting;Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting》 | 2011年
95.Investigation of the GaP/Si Interface by High-Resolution Scanning Transmission Electron Microscopy

机译：GaP / Si界面的高分辨率扫描透射电镜研究
- 作者：A. Beyer; J. Ohlmann; M. Luysberg; K. Volz
- 会议名称：《International Metallographic Society Annual meeting;Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting》 | 2011年
96.Progress on the Development of DEPFET Based SDD and MPD Detectors

机译：基于DEPFET的SDD和MPD检测器的开发进展
- 作者：J.Treis; K.Heinzinger; K.Hermenau; S.Herrmann; T.Lauf; P.Lechner; G.Lutz; P.Majewski; M.Porro; R.H.Richter; G.Schaller; F.Schopper; H.Soltau; L.Strüder; G.de Vita
- 会议名称：《International Metallographic Society Annual meeting;Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting》 | 2011年
97.Direct Observation of Magnetic Interactions at Structural and Compositional Interfaces in Fe-Ti Oxides Using Lorentz Microscopy and Electron Holography

机译：使用Lorentz显微镜和电子全息图直接观察Fe-Ti氧化物的结构和组成界面处的磁性相互作用
- 作者：T. Kasama; R.J. Harrison; N.S. Church; J.M. Feinberg; R.E. Dunin-Borkowski
- 会议名称：《International Metallographic Society Annual meeting;Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting》 | 2011年
98.Atomic Scale Chemical Mapping in SrO(SrTiO_3)_6 Ruddlesden-Popper Thin Film

机译：SrO（SrTiO_3）_6 Ruddlesden-Popper薄膜中的原子尺度化学作图
- 作者：Ye Zhu; Che-Hui Lee; Darrell G. Schlom; David A. Muller
- 会议名称：《International Metallographic Society Annual meeting;Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting》 | 2011年
99.Low Dose High-Resolution Electron Microscopy (HREM) of Poly(3,4-Ethylene Dioxythiophene) (PEDOT) Films

机译：聚（3,4-乙撑二氧噻吩）（PEDOT）膜的低剂量高分辨率电子显微镜（HREM）
- 作者：Jinghang Wu; David C. Martin
- 会议名称：《International Metallographic Society Annual meeting;Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting》 | 2011年
100.Interface and Defect Structures in Epitaxial Thin Films of LaCuOSe and Related Compounds by HAADF-STEM Observations

机译：HAADF-STEM观察LaCuOSe和相关化合物外延薄膜的界面和缺陷结构
- 作者：T. Tohei; T. Mizoguchi; H. Hiramatsu; H. Hosono; Y. Ikuhara
- 会议名称：《International Metallographic Society Annual meeting;Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting》 | 2011年