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Investigation of the Internal Amplification Effect on Planar (p{sup}+-n-n{sup}+) Structures Made of High-Resistivity Silicon

机译:对由高电阻率硅制成的平面(p {sup} +-n-n {sup} +)结构的内部放大作用的研究

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摘要

The first results of studies of special strip and pixel silicon detectors are presented. The detector structures allow the creation of high electrical fields (5 ×10{sup}5 V/cm) near p-n junctions that are powerful enough to initiate an avalanche multiplication of charge carriers. The possibility of internal amplification in a semiconductor detector similar to the proportional amplification in gas counters is shown. The spectrum of α particles from 238{sup left}Pu (E{sub}α = 5.5 MeV) demonstrates an "amplified" peak at an energy of 70.2 MeV and an energy resolution FWHM = 10.2 MeV.
机译:提出了对特殊的条形和像素硅探测器的研究的初步结果。探测器结构允许在p-n结附近产生高电场(5×10 {sup} 5 V / cm),该电场足以引发电荷载流子的雪崩倍增。显示了与气体计数器中的比例放大类似的半导体检测器内部放大的可能性。来自238Pu(E {sub}α= 5.5 MeV)的α粒子的光谱显示出在能量70.2 MeV和能量分辨率FWHM = 10.2 MeV时的“放大”峰。

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