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首页> 外文期刊>Applied optics >Photometric methods for determining the optical constants and the thicknesses of thin absorbing films: criteria for precise and unambiguous determination of n, k, and d in a wide spectral range
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Photometric methods for determining the optical constants and the thicknesses of thin absorbing films: criteria for precise and unambiguous determination of n, k, and d in a wide spectral range

机译:用于确定吸收薄膜的光学常数和厚度的光度法:在宽光谱范围内精确,毫不含糊地确定n,k和d的标准

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摘要

The application of error analysis within a certain algorithm for the most accurate and unambiguous determination of refractive index n, absorption coefficient k, and thickness d of thin absorbing films in a wide spectral range is illustrated with three examples. Thin films of a dye, Ag, and Au are selected because their optical constants (small n for Ag and Au and considerable variations of n and k for the dye films) along with their thinness make investigating these thin films difficult. The important steps of the algorithm that ensure reliable isolation of the physically correct solutions and maximum accuracy of n and k in the spectral range investigated are also demonstrated.
机译:通过三个示例说明了在特定算法中进行误差分析以最准确,最明确地确定宽光谱范围内的薄膜的折射率n,吸收系数k和厚度d的应用。选择染料,Ag和Au的薄膜是因为它们的光学常数(Ag和Au的n较小,染料膜的n和k的变化很大)以及其厚度使研究这些薄膜变得困难。还展示了算法的重要步骤,这些步骤可确保可靠隔离物理正确的解,并确保所研究的光谱范围内n和k的最大准确性。

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