A NEW PHOTOMETRIC REFLECTANCE METHOD FOR THE DETERMINATION OF THE OPTICAL CONSTANTS OF CRYSTALS

摘要

A new photometric method for the determination of the real and imaginary parts of the complex index of refraction for both isotropic and anisotropic substances has been developed. The method consists of determining the angle of incidence at which one encounters the minimum reflectance for the parallel polarization, and the ratio of the reflectance for the parallel and perpendicular polarizations at that same angle of incidence.