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机译:ND3 + -SubstIT对薄膜漏电流,铁电和介电性能的影响
Univ Jinan Sch Mat Sci &
Engn Jinan 250022 Shandong Peoples R China;
Univ Jinan Sch Mat Sci &
Engn Jinan 250022 Shandong Peoples R China;
Univ Jinan Sch Mat Sci &
Engn Jinan 250022 Shandong Peoples R China;
Univ Jinan Sch Mat Sci &
Engn Jinan 250022 Shandong Peoples R China;
Univ Jinan Sch Mat Sci &
Engn Jinan 250022 Shandong Peoples R China;
Univ Jinan Sch Mat Sci &
Engn Jinan 250022 Shandong Peoples R China;
Perovskite; Thin film; Cation substitution; Microstructure; Electrical property;
机译:ND3 + -SubstIT对薄膜漏电流,铁电和介电性能的影响
机译:微观结构,漏电流和介电可调性,W6 +:Na0.5bi0.5tio3 / Fe3 +:Na0.5bi0.5tio3双层薄膜
机译:退火温度对掺W的Na0.5Bi0.5TiO3薄膜的微观结构,铁电和介电性能的影响
机译:脉冲激光沉积在各种单晶衬底上生长的无铅铁电Na0.5Bi0.5TiO3薄膜的外延生长和性能
机译:锆钛酸铅镧铅薄膜的介电和铁电性质,用于电容储能。
机译:具有表面过渡层的铁电薄膜的介电性能
机译:热处理对Na0.5bi0.5tio3薄膜结构和漏电流的影响