Design of metal-dielectric resonant-cavity thin-film structures using the effective reflectance index method

摘要

A mathematical design process for the resonant condition of metal-dielectric cavity designs is presented in this paper. The technique is based on the effective reflectance index of multilayer thin films, and the complex refractive indices of the films are self-consistently included. The scaling behavior of metal-dielectric structures as a function of wavelength for different metals is analyzed from the visible to near-infrared spectrum. The maximum achievable peak transmission, as well as the design trade-offs among sheet resistance, resonant wavelength, and the choice of metals, has been calculated. (c) 2018 Optical Society of America