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首页> 外文期刊>Journal of Sol-Gel Science and Technology >Influence of metal (M = Cd, In, and Sn) dopants on the properties of spin-coated WO3 thin films and fabrication of temperature-dependent heterojunction diodes
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Influence of metal (M = Cd, In, and Sn) dopants on the properties of spin-coated WO3 thin films and fabrication of temperature-dependent heterojunction diodes

机译:金属(M = Cd,Sn和Sn)掺杂剂对旋涂WO3薄膜性能的影响及温度依赖性异质结二极管的制备

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Metal-doped tungsten trioxide (M = Cd, In, and Sn:WO3) thin films were prepared using sol-gel spin-coating and their structural, optical, electrical properties were studied for the fabrication of p-n heterojunction diode. X-ray diffraction (XRD) analysis revealed that Cd, In, and Sn dopants have a strong influence on the lattice parameters and defect factor without making any changes in the structure. Scanning electron microscope (SEM) images reflect that the dopants have a strong impact on the surface morphologies of the WO3 thin film. The UV-visible analysis shows a high optical transmittance (similar to 82%) and variation in the bandgap was also obtained. The dc electrical conductivity (sigma(dc)) indicates that the band conduction mechanism is predominant in the pure and doped M:WO3 thin films. Current density-voltage (J-V) characteristics of WO3/p-Si, Cd:WO3/p-Si, In:WO3/p-Si, and Sn:WO3/p-Si diodes were measured under dark and illumination conditions. In which, the Sn:WO3/p-Si diode exhibits better performance with good ideality factor (n = 2.6) and barrier height (CYRILLIC CAPITAL LETTER EFB = 0.90) values for under illumination. Most importantly, the J-V-T characteristics of all the fabricated diodes were analyzed with different temperatures (303-423 K).
机译:使用溶胶 - 凝胶旋转涂层制备金属掺杂三氧化钨(M = Cd,IN和Sn:WO3)薄膜,并研究了它们的结构,光学,电性能,用于制造P-N异质结二极管。 X射线衍射(XRD)分析显示CD,IN和Sn掺杂剂对晶格参数和缺陷因子具有很大的影响而不会发生结构的任何变化。扫描电子显微镜(SEM)图像反映掺杂剂对WO3薄膜的表面形态产生强烈影响。 UV可见分析显示出高光学透射率(类似于82%),也获得了带隙的变化。直流电导率(Sigma(DC))表明带传导机制在纯和掺杂的M:WO3薄膜中是主要的。 WO3 / P-Si,Cd:WO3 / P-Si的电流密度 - 电压(J-V)特性:WO3 / P-Si和Sn:在暗和照明条件下测量WO3 / P-Si二极管。其中,SN:WO3 / P-Si二极管具有良好的性能,在照明下具有良好的理想因子(n = 2.6)和阻挡高度(西里尔基大写字母EFB = 0.90)值。最重要的是,用不同的温度(303-423 k)分析所有制造二极管的J-V-T特征。

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