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首页> 外文期刊>Journal of Materials Chemistry, C. materials for optical and electronic devices >Langmuir films and uniform, large area, transparent coatings of chemically exfoliated MoS2 single layers
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Langmuir films and uniform, large area, transparent coatings of chemically exfoliated MoS2 single layers

机译:Langmuir薄膜和均匀,大面积,透明涂层的化学剥离MOS2单层

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摘要

By manipulating colloidal dispersions of chemically exfoliated molybdenum disulfide (MoS2) into an appropriate spreading solvent, we demonstrate, for the first time, the ability to form stable, floating MoS2 Langmuir films without the use of surfactants or significant material loss into the aqueous sub-phase. While the floating sheets can be compressed into a densely tiled film by the barriers of a traditional Langmuir-Blodgett trough, we also report an edge-to-edge aggregation and spreading driven densification phenomena that allows the film to be built up from the outside of the trough inwards during the deposition process. Continued deposition allows us to fill the entire trough with a dense (85-95% coverage) film of discretely tiled 1T MoS2 nanosheets and to coat substrates as large as 130 cm(2). The transfer efficiency is found to be as high as 120 m(2) of coated area per gram of deposited MoS2. Comparing the transfer efficiency to the theoretical specific surface area of MoS2 provides a method to estimate film thickness and exfoliation efficiency. Atomic force microscopy and optical absorption measurements are used to corroborate this estimate of 2.7 layers for the traditional n-butyllithium exfoliation method used. We demonstrate that the films can be built up layer-by-layer and investigate the optical and electrical properties of the films before and after conversion from the 1T to 2H polymorph.
机译:通过操纵化学剥离钼二硫化钼(MOS2)的胶体分散体,在不使用表面活性剂或显着的材料损失进入含水子的情况下形成稳定的稳定性,浮动MOS2 Langmuir薄膜的能力或将浮动MOS2 Langmuir膜的能力进行说明。阶段。虽然浮动片材可以通过传统的Langmuir-Blodgett槽的屏障压缩成密集的薄膜,但我们还报告了一个边缘到边缘聚集和扩展驱动的致密化现象,允许胶片从外部建造在沉积过程中向内槽。继续沉积允许我们填充整个槽,具有致密(85-95%覆盖)薄膜离散地铺线的1T MOS2纳米片,并涂覆大至130cm(2)的基板。发现转移效率高达120米(2)克沉积MOS2的涂覆面积。将转移效率与MOS2的理论特异表面积进行比较提供了一种估计膜厚度和剥离效率的方法。原子力显微镜和光学吸收测量用于证实所用正丁基锂剥离方法的2.7层的估计。我们证明,薄膜可以逐层建立并研究从1T至2H多晶型物转换之前和之后膜的光学和电性能。

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