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Photoconductivity and AFM study of nitrogen doped a: DLC films

机译:氮掺杂A:DLC薄膜的光电导和AFM研究

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We present the results of photoconductivity, photosensitivity, and decay time of photocurrentmeasurement as a function of temperature, for both nitrogen doped (N-DLC) and nondoped a:DLCfilms. The a:DLC films were deposited using RF glow discharge of methane gas (CH{sub}4) as asource of carbon. Several films were doped employing nitrogen (N{sub}2) as doping gas. Thespectral response of photosensitvity of doped films shifts to higher energy, similar to the measuredoptical energy gap of these films. Unlike the photosensitivity, the photocurrent of doped film is largerby two orders of magnitude than that of nondoped film. The mobility of doped films (2.43×l0{sup}-5) is also larger by two orders of magnitude than the nondoped films (5.64× l0{sup}-7) atroom temperature. In order to provide nano-scale information about the morphological properties ofthe a:DLC and N-DLC films surface we have used the atomic force microscope.
机译:对于氮掺杂(N-DLC)和NONDOPED A:DLCFILMS,我们介绍了光电导率的光电导率,光敏性和衰减时间的光电流浆料的结果。 A:DLC薄膜使用甲烷气体(CH {SUB} 4)的RF发光放电作为碳源。 将几件薄膜掺杂使用氮气(n {sub} 2)作为掺杂气体。 掺杂薄膜光敏性的感测响应转移到更高的能量,类似于这些薄膜的测量功率差距。 与光敏性不同,掺杂薄膜的光电流比掺杂薄膜的两个数量级大。 掺杂薄膜的迁移率(2.43×L0 {sup} -5)也比Nondoped薄膜(5.64×L0 {sup} -7)在浴室温度下的两个数量级变大。 为了提供关于A:DLC和N-DLC膜表面的形态学性质的纳米级信息,我们使用了原子力显微镜。

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