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首页> 外文期刊>Technical physics >Synthesis of Hexagonal AlN and GaN Layers on a Si(100) Substrate by Chloride Vapor-Phase Epitaxy
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Synthesis of Hexagonal AlN and GaN Layers on a Si(100) Substrate by Chloride Vapor-Phase Epitaxy

机译:用氯气相外延对Si(100)底物上的六边形Aln和GaN层的合成

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Synthesis of AlN and GaN layers on a Si(100) substrate by chloride vapor-phase epitaxy has been considered. The process includes sulfidizing of the silicon surface, nucleation and growth of an AlN layer, and then formation of a GaN/AlN structure. It has been found that in the case of a (100)Si substrate, GaN nucleates on buffer AlN layers that may have two crystallographic orientations in contrast to a Si(111) substrate, on which a buffer layer may have only one orientation. It has been shown that the treatment of the Si(100) substrate in an aqueous solution of (NH4)(2)S decreases the FWHM of the rocking curve for GaN(0002) by a factor of 1.5.
机译:考虑了氯化物气相外延的Si(100)底物上的AlN和GaN层的合成。 该方法包括硫化硅表面,成核和生长AlN层,然后形成GaN / AlN结构。 已经发现,在(100)Si衬底的情况下,GaN在缓冲液ALN层上成核,其可以具有与Si(111)衬底对比的两个晶形取向,缓冲层可以仅在其上具有一个方向。 已经表明,在(NH 4)(2)秒的水溶液中的Si(100)衬底将GaN(0002)的摇摆曲线的FWHM降低为1.5。

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