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首页> 外文期刊>Physica Scripta: An International Journal for Experimental and Theoretical Physics >Explicit continuous models of drain current, terminal charges and intrinsic capacitance for a long-channel junctionless nanowire transistor
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Explicit continuous models of drain current, terminal charges and intrinsic capacitance for a long-channel junctionless nanowire transistor

机译:用于长通道连接纳米线晶体管的漏极电流,终端电荷和固有电容的明确连续模型

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摘要

An explicit charge-based solution for the drain current, terminal charges and intrinsic capacitance of a long-channel junctionless nanowire transistor (JNT) incorporating the importance of an interface trap density that affect the threshold voltage and the subthreshold slope is presented in this study. Initially, a continuous implicit solution of the unified charge-based control model (UCCM) is derived from the 1D Poisson equation by invoking the parabolic potential approximation. The the continuous solution of the mobile charge density at the source/drain is obtained by adding the decoupled UCCM expression for the depletion and complementary parts, where each part is explicitly solved using the Lambert function without having an additional smoothing function to unify the two limits. The omission of an additional smoothing function could lead to a shorter computation time. Secondly, by solving Pao-Sah's dual integral, a continuous charge-based expression for the drain current is derived. The expressions for the terminal charge are then derived based on the decoupled drain current model that also becomes an input for computing all four independent capacitances of the JNT. The explicit continuous models show a good agreement with numerical simulation over practical terminal voltages, doping levels, and geometry effects. For a given maximum surface potential error of 5%, the model is accurate for a dopant-geometry ratio of 0.001 < qN(D)R(2)/4 epsilon(Si) < 0.3 and it is also independent of fitting parameters that may vary for different terminal biases or dopant geometries. The nonpiecewise models for drain current, terminal charges and intrinsic capacitance are significantly resolved by decoupling the mobile charge into depletion and complementary parts with no additional smoothing function to unify between operating regions, and omitting fitting parameters that have no physical meaning.
机译:本研究提出了一种具有影响影响阈值电压的接口陷阱密度和亚阈值斜坡的界面陷阱密度的重要性的漏极电流,终端电荷和固有电容的基于显式电荷的解决方案。最初,通过调用抛物线电位近似来源于1D泊松方程,从1D泊松方程导出的连续隐式解。通过向耗尽和互补部件添加分离的UCCM表达来获得源/漏极处的移动电荷密度的连续解决方案,其中使用兰伯特功能明确解决每个部分而不具有额外的平滑功能来统一两个限制。省略额外的平滑功能可能导致较短的计算时间。其次,通过求解Pao-Sah的双积分,推导出对漏极电流的连续电荷基表达。然后基于解耦漏极电流模型导出用于终端电荷的表达式,该漏极电流模型也成为用于计算JNT的所有四个独立电容的输入。明确的连续模型与实际终端电压,掺杂水平和几何效果的数值模拟显示出良好的一致性。对于5%的给定最大表面电位误差,该模型的掺杂剂 - 几何比为0.001

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