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Epitaxial growth of silicon nanowire arrays at wafer-scale using high-speed rotating-disk CVD for improved light-trapping

机译:使用高速转盘CVD外延生长晶圆级硅纳米线阵列以改善光捕获

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摘要

Silicon nanowires (Si-NWs) have been fabricated at wafer-scale with Au nanoparticles as catalysts at 500 degrees C using a chemical-vapor- deposition (CVD) method combined with a high-speed rotation wafer-disk. High resolution TEM and SAED patterns were used to characterize the microstructures of the grown Si-NWs. Single crystalline Si-NWs appear self-oriented on Si (100) substrates along the < 111 > growth axis. The nanowires have a uniform diameter of 50 nm and varying lengths and densities depending on the rotation speed of the wafer substrate. The effects of wafer-rotation speed on the growth of Si-NWs are discussed. Due to a reduced boundary layer thickness, fast mass transport leads to both an enhanced growth rate and density of the Si-NWs. Moreover, the density of the Si-NW array is optimized to achieve a low reflectance loss for their further application in tandem solar cells as the light-trapping layer.
机译:硅纳米线(Si-NWs)已在500摄氏度下使用化学气相沉积(CVD)方法与高速旋转晶圆盘相结合,以金纳米颗粒作为催化剂在晶圆级制造。高分辨率的TEM和SAED图案用于表征生长的Si-NW的微观结构。单晶Si-NW在Si(100)衬底上沿<111>生长轴自取向。纳米线具有50nm的均匀直径,并且取决于晶片衬底的旋转速度而变化的长度和密度。讨论了晶片旋转速度对Si-NWs生长的影响。由于减小的边界层厚度,快速的质量传输导致Si-NW的增加的生长速率和密度。此外,Si-NW阵列的密度被优化以实现低反射率损失,以将其进一步应用于串联太阳能电池中作为光捕获层。

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