首页> 外国专利> SOI STRUCTURE USING SILICON EPITAXIAL GROWTH METHOD AND FABRICATING METHOD THEREOF FOR REDUCING FABRICATING COST AND IMPROVING INSULATING FUNCTION BY FORMING INSULATOR AND TRENCH ON SILICON SUBSTRATE AND PERFORMING EPITAXIAL SILICON GROWTH PROCESS

SOI STRUCTURE USING SILICON EPITAXIAL GROWTH METHOD AND FABRICATING METHOD THEREOF FOR REDUCING FABRICATING COST AND IMPROVING INSULATING FUNCTION BY FORMING INSULATOR AND TRENCH ON SILICON SUBSTRATE AND PERFORMING EPITAXIAL SILICON GROWTH PROCESS

机译:利用硅表皮生长法及其制造方法的SOI结构,可通过在硅基体上形成绝缘层和沟槽来降低制造成本并提高绝缘功能,并执行表皮硅生长过程

摘要

PURPOSE: An SOI structure using a silicon epitaxial growth method and a fabricating method thereof are provided to reduce the fabricating cost and improve an insulating function by forming an insulator and a trench on a silicon substrate and performing an epitaxial silicon growth process. CONSTITUTION: An insulator is formed on a silicon wafer. An epitaxial trench is formed by patterning and etching the insulator. An epitaxial silicon is grown thereon after the epitaxial trench is formed. An STI(16) is formed by patterning the epitaxial silicon. A planarization process is performed. A semiconductor device(18-22) is formed.
机译:目的:提供一种使用硅外延生长方法的SOI结构及其制造方法,以通过在硅基板上形成绝缘体和沟槽并执行外延硅生长工艺来降低制造成本并提高绝缘功能。构成:在硅晶片上形成绝缘体。通过图案化和蚀刻绝缘体来形成外延沟槽。在形成外延沟槽之后,在其上生长外延硅。通过图案化外延硅来形成STI(16)。执行平坦化工艺。形成半导体器件(18-22)。

著录项

  • 公开/公告号KR20050002941A

    专利类型

  • 公开/公告日2005-01-10

    原文格式PDF

  • 申请/专利权人 DONGBUANAM SEMICONDUCTOR INC.;

    申请/专利号KR20030042290

  • 发明设计人 KIM MIN SEOK;

    申请日2003-06-27

  • 分类号H01L27/12;

  • 国家 KR

  • 入库时间 2022-08-21 22:06:02

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