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Si (100) and (110) etching properties in 5, 15, 30 and 48 wt%KOH aqueous solution containing Triton-X-100

机译:Si(100)和(110)蚀刻性质在5,15,30和48wt%KOH水溶液中的含有Triton-x-100

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摘要

This paper reports the effects of non-ionic surfactant, Triton-X-100 (Triton), on the etching of Si (100) and (110) in 5, 15, 30, and 48 wt% potassium hydroxide (KOH) solutions. In a pure 5 wt% KOH solution, micropyramids are visible on the Si (100) etched surface. A roof-like shape appears on the Si (110) etched surface. However, in 5 wt% KOH with addition of ppb-level Triton, the etched surface became mirror-like. Furthermore, the etching rate decreased greatly when a ppb-level of Triton added to 5 wt% KOH solution. However, for more highly concentrated KOH solutions, the Triton effect became less effective. From activation energy change obtained from the results, it is apparent that ppb-level Triton in lower concentration KOH solutions adsorbed onto the silicon surface and made the etching from reaction-limited to diffusion-limited process. On the other hand, for higher concentration KOH solutions, Triton seems to lose the function because the activation energy remained in a level of reaction-limited process.
机译:本文报道了非离子表面活性剂,Triton-X-100(Triton)的影响在5,15,30和48wt%氢氧化钾(KOH)溶液中的Si(100)和(110)的蚀刻中。在纯5wt%的KOH溶液中,在Si(100)蚀刻表面上可见微嘧啶。 Si(110)蚀刻表面上出现屋顶形状。然而,在加入PPB级Triton的5wt%KOH中,蚀刻表面变为镜状。此外,当加入5wt%KOH溶液的PPB水平时,蚀刻速率大大降低。然而,对于更高度浓缩的KOH解决方案,TRITON效果变得较低。从结果获得的激活能量变化,显然是在硅表面上吸附在硅表面上的低浓度KOH溶液中的PPB级Triton,并使蚀刻限制为扩散限制过程。另一方面,对于较高浓度的KOH溶液,Triton似乎失去了功能,因为活化能量保持在反应限制过程的水平。

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