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机译:使用光声光谱测量的热蒸发IN2S3薄膜的光学性质
Sri Venkateswara Univ Dept Phys Solar Photovolta Lab Tirupati 517502 Andhra Prades India;
Sri Venkateswara Univ Dept Phys Solar Photovolta Lab Tirupati 517502 Andhra Prades India;
Sri Venkateswara Univ Dept Phys Solar Photovolta Lab Tirupati 517502 Andhra Prades India;
Sri Govindaraja Swamy Arts Coll Dept Phys Tirupati 517502 Andhra Prades India;
Koszalin Univ Technol Dept Elect &
Comp Sci PL-75453 Koszalin Poland;
Koszalin Univ Technol Dept Elect &
Comp Sci PL-75453 Koszalin Poland;
Koszalin Univ Technol Dept Elect &
Comp Sci PL-75453 Koszalin Poland;
Belarusian State Univ Dept Energy Phys Nezavisimosti 4 Av Minsk 220030 Byelarus;
Natl Acad Sci Sci &
Pract Mat Res Ctr Minsk 220072 Byelarus;
Thermal evaporation; In2S3; Thin films; GIXD; SEM; Photoacoustic spectroscopy; Optical properties;
机译:使用光声光谱测量的热蒸发IN2S3薄膜的光学性质
机译:退火对热蒸发IN2S3薄膜物理性质的影响
机译:热蒸发制备的In2S3薄膜的微观结构和光学性质
机译:在不同温度下的热蒸发Cu_2S薄膜的结构,形态和光学性质
机译:热蒸发CdSe薄膜的光电性能研究。
机译:低真空度热蒸发法制备a-Se薄膜的结构光学和X射线响应特性研究
机译:使用\ ud的Cd2SnO4薄膜的热和光学性质 光声光谱