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The time-decaying critical current density of a type-PI superconductor and its measuring method

机译:PI型超导体的时衰减临界电流密度及其测量方法

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摘要

The paper will show that a critical current which has been thought to be defined only in the critical state of a type-PI superconductor is able to measure by making use of its time-decaying behavior below onset currents of the resistive state due to flux creep. This is a kind of adiabatic process, in which the measurement of critical currents is done by waiting for a quench which takes place when the persistent current induced in a superconducting sample goes cross the time-decaying critical current and also is a method measuring life of the persistent current in the sample. According to this method, potential barrier models for flux pinning and characteristic parameters about superconductors will be determined.
机译:该论文将表明,被认为仅在PI型超导体的临界状态下定义的临界电流能够通过利用其随时间变化的行为来测量,该时间衰减行为低于由于磁通蠕变引起的电阻状态的起始电流。这是一种绝热过程,其中临界电流的测量是通过等待超导样品中感应的持续电流越过时间衰减的临界电流时发生的猝灭来完成的,它也是一种测量寿命的方法。样品中的持续电流。根据这种方法,将确定用于磁通钉扎的势垒模型和有关超导体的特征参数。

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