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Inductive Technique for Measuring Critical Current Densities in Thin-Film Superconductors.

机译：用于测量薄膜超导体临界电流密度的感应技术。

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作者
Talvacchio, J.;
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年度 1982
页码 1-7
总页数 7
原文格式 PDF
正文语种 eng
中图分类工业技术;
关键词
Inductance; Current density; Measurement; Superconductors; Thin films; Functions(Mathematics); Mathematical models; Temperature; Magnetic fields; Reprints;

机译：电感;电流密度;测量;超导体;薄膜;功能（数学）;数学模型;温度;磁场;重印;

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专利

1. Inductive technique for measuring critical current densities in thin‐film superconductors [J] . Review of Scientific Instruments . 1983,第1期

机译：感应技术，用于测量薄膜超导体中的临界电流密度
2. Magnetization of Synthetic Filamentary Superconductors. B. The Dependence of the Critical Current Density on Temperature and Magnetic Field [J] . Watson J. H. P. Journal of Applied Physics . 1968,第7期

机译：合成丝状超导体的磁化。 B.临界电流密度对温度和磁场的依赖性
3. Numerical Investigation of Inductive and Permanent-Magnet Methods to Measure Critical Current Density of HTS Thin Films [J] . Takayama T., Kamitani A., Hattori K., Applied Superconductivity, IEEE Transactions on . 2011,第3期

机译：感应和永磁方法测量高温超导薄膜临界电流密度的数值研究
4. Numerical Simulation of Inductive Method and Permanent Magnet Method for Measuring Critical Current Density [C] . Atsushi Kamitani, Teruou Takayama, Soichiro Ikuno Compumag . 2007

机译：感应法和永磁体法测量临界电流密度的数值模拟
5. Understanding Why Grain Boundaries Limit the Critical Current Density of Fe-Based Superconductors and Exploring Ways to Increase Current Density [D] . Collantes Goicochea, Yesusa Kimberlim. 2018

机译：了解为什么谷物边界限制了Fe基超导体的临界电流密度，并探讨了提高电流密度的方法
6. Charge Density not Current Density is a More Comprehensive Safety Measure of Transcranial Direct Current Stimulation [O] . Pratik Y. Chhatbar, Mark S. George, Steven A. Kautz, -1

机译：电荷密度而非电流密度是经颅直流电刺激的更全面的安全措施
7. Properties and Applications of Bulk High Temperature Superconductors. Enhancement of Critical Current Densities by Radiation in RE-Ba-Cu-O Bulk Superconductor. [O] . Noriko CHIKUMOTO 1999

机译：批量高温超导体的性质及应用。 RE-BA-CU-O散装超导体辐射提高临界电流密度。
8. Inductive Technique for Measuring Critical Current Densities in Thin-Film Superconductors [R] . Talvacchio, J. 1982

机译：用于测量薄膜超导体临界电流密度的感应技术

Inductive Technique for Measuring Critical Current Densities in Thin-Film Superconductors.

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