...
首页> 外文期刊>Physical review, B >Scattering of carriers by coupled plasmon-phonon modes in bulk polar semiconductors and polar semiconductor heterostructures
【24h】

Scattering of carriers by coupled plasmon-phonon modes in bulk polar semiconductors and polar semiconductor heterostructures

机译:通过耦合的等离子体 - 声子模式散射散射载体和极性半导体和极性半导体异质结构

获取原文
获取原文并翻译 | 示例

摘要

We present a general treatment of carrier scattering by coupled phonon-plasmon collective modes in polar semiconductors, taking anharmonic phonon decay into account and self-consistently calculating carrier momentum relaxation rates and carrier mobility in a parabolic band model. We iteratively solve the weak-field Boltzmann equations for carriers and collective modes and obtain their nonequilibrium distribution functions. Both the scattering rates and the anharmonic decay of the coupled modes are expressed through the total dielectric function of the semiconductor, consisting of a damped lattice dielectric function, and a temperature dependent random phase approximation dielectric function for the carrier plasma. We show that the decay of the coupled modes has a significant effect on the contribution to the mobility limited by carrier-coupled mode scattering. We also propose a scalar quantity, the phonon dissipation weight factor, with which this effect can be estimated from an analytic expression. We apply this treatment to dynamically screened electron-longitudinal optical phonon scattering in bulk polar semiconductors, and to dynamically screened remote phonon scattering in polar heterostructures where monolayers of MoS2 are sandwiched between various polar dielectrics. We find that a dynamic treatment of the remote phonon scattering yields mobilities up to 75% higher than a static screening approximation does for structures which consist of a monolayer of MoS2 between hafnia and silica. Moreover, we show that accounting for the nonzero thickness of the MoS2 interface layer has an important effect on the calculated mobility in the same structure.
机译:我们介绍了通过耦合的声子 - 等离子模块在极性半导体中的载波散射的一般处理,以Anharmonic声子衰减考虑到抛物带模型中的载波动量弛豫率和载流子迁移率。我们迭代地解决载体和集体模式的弱现场Boltzmann方程,并获得它们的非质量分布函数。耦合模式的散射速率和anharmonic衰减都是通过半导体的总介电功能表示,由阻尼晶格介质功能组成,以及用于载体等离子体的温度相关的随机相位近似介质函数。我们表明耦合模式的衰减对通过载波耦合模式散射的迁移率限制的贡献具有显着影响。我们还提出了标量数,声音耗散重量因子,可以从分析表达估计这种效果。我们将该处理应用于在散装极性半导体中动态筛选的电子纵向光学声子散射,并在极性异质结构中动态筛选远程声子散射,其中MOS2的单层夹在各种极性电介质之间。我们发现对远程声子散射的动态处理产生高达75%的静态屏蔽近似,对于由Hafnia和二氧化硅之间的单层MOS2组成的结构。此外,我们表明MOS2接口层的非零厚度的算法对同一结构中计算的迁移率具有重要影响。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号