...
首页> 外文期刊>Physical chemistry chemical physics: PCCP >Electron-phonon scattering effect on the lattice thermal conductivity of silicon nanostructures
【24h】

Electron-phonon scattering effect on the lattice thermal conductivity of silicon nanostructures

机译:电子 - 声子散射对硅纳米结构的晶格导热率的影响

获取原文
获取原文并翻译 | 示例

摘要

Nanostructuring technology has been widely employed to reduce the thermal conductivity of thermoelectric materials because of the strong phonon-boundary scattering. Optimizing the carrier concentration can not only improve the electrical properties, but also affect the lattice thermal conductivity significantly due to the electron-phonon scattering. The lattice thermal conductivity of silicon nanostructures considering electron-phonon scattering is investigated for comparing the lattice thermal conductivity reductions resulting from nanostructuring technology and the carrier concentration optimization. We performed frequency-dependent simulations of thermal transport systematically in nanowires, solid thin films and nanoporous thin films by solving the phonon Boltzmann transport equation using the discrete ordinate method. All the phonon properties are based on the first-principles calculations. The results show that the lattice thermal conductivity reduction due to the electron-phonon scattering decreases as the feature size of nanostructures goes down and could be ignored at low feature sizes (50 nm for n-type nanowires and 20 nm for p-type nanowires and n-type solid thin films) or a high porosity (0.6 for n-type 500 nm-thick nanoporous thin films) even when the carrier concentration is as high as 1021 cm(-3). Similarly, the size effect due to the phonon-boundary scattering also becomes less significant with the increase of carrier concentration. The findings provide a fundamental understanding of electron and phonon transports in nanostructures, which is important for the optimization of nanostructured thermoelectric materials.
机译:纳米结构化的技术已被广泛采用,以减少因强声子界散射的热电材料的热导率。优化载流子浓度,不仅可以提高电特性,而且还影响显著晶格热导率由于电子 - 声子散射。考虑电子 - 声子散射硅纳米结构的晶格热导率进行了研究,用于比较从纳米结构化技术和载流子浓度的优化产生的晶格热导率降低。我们通过使用离散坐标法求解声子玻尔兹曼输运方程进行系统地在纳米线的热传输的频率相关的模拟中,固体薄膜和纳米多孔薄膜。所有的声子特性是基于第一性原理计算。结果表明,晶格热导率降低是由于电子 - 声子散射而减小作为纳米结构的特征尺寸下降,并可能在低的特征尺寸(对于n型纳米线50 nm,对于p型纳米线20 nm和被忽略n型固体薄膜),或用于n型500 nm厚的纳米多孔薄膜),即使载流子浓度则高达1021厘米(-3)的高孔隙率(0.6。类似地,由于声子界散射尺寸效应也变得与载流子浓度的增加而较少显著。该发现提供电子和声子传输的纳米结构有基本的了解,这是纳米结构的热电材料的优化很重要的。

著录项

  • 来源
  • 作者

    Fu Bo; Tang Guihua; Li Yifei;

  • 作者单位

    Xi An Jiao Tong Univ Sch Energy &

    Power Engn MOE Key Lab Thermofluid Sci &

    Engn Xian 710049 Shaanxi Peoples R China;

    Xi An Jiao Tong Univ Sch Energy &

    Power Engn MOE Key Lab Thermofluid Sci &

    Engn Xian 710049 Shaanxi Peoples R China;

    Xi An Jiao Tong Univ Sch Energy &

    Power Engn MOE Key Lab Thermofluid Sci &

    Engn Xian 710049 Shaanxi Peoples R China;

  • 收录信息
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 物理学 ; 化学 ;
  • 关键词

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号