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GaAsBi/GaAs multi-quantum well LED grown by molecular beam epitaxy using a two-substrate-temperature technique

机译:使用双基板温度技术,通过分子束外延生长Gaasbi / GaAs多量子良好的LED

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We report a GaAs0.96Bi0.04/GaAs multiple quantum well (MQW) light emitting diode ( LED) grown by molecular beam epitaxy using a two-substrate-temperature (TST) technique. In particular, the QWs and the barriers in the intrinsic region were grown at the different temperatures of T-GaAsBi = 350 degrees C and T-GaAs = 550. degrees C, respectively. Investigations of the microstructure using transmission electron microscopy (TEM) reveal homogeneous MQWs free of extended defects. Furthermore, the local determination of the Bi distribution profile across the MQWs region using TEM techniques confirm the uniform Bi distribution, while revealing a slightly chemically graded GaAs-on-GaAsBi interface due to Bi surface segregation. Despite this small broadening, we found that Bi segregation is significantly reduced ( up to 18% reduction) compared to previous reports on Bi segregation in GaAsBi/GaAs MQWs. Hence, the TST procedure proves as a very efficient method to reduce Bi segregation and thus increase the quality of the layers and interfaces. These improvements positively reflect in the optical properties. Room temperature photoluminescence and electroluminescence (EL)at 1.23 mu m emission wavelength are successfully demonstrated using TST MQWs containing less Bi content than in previous reports. Finally, LED fabricated using the present TST technique show currentvoltage (I-V) curves with a forward voltage of 3.3 V at an injection current of 130 mA under 1.0 kA cm(-2) current excitation. These results not only demonstrate that TST technique provides optical device quality GaAsBi/GaAs MQWs but highlight the relevance of TST-based growth techniques on the fabrication of future heterostructure devices based on dilute bismides.
机译:我们通过使用双基板温度(TST)技术来报告由分子束外延生长的GaAs0.96bi0.04 / GaAs多量子阱(MQW)发光二极管(LED)。特别地,在T-GaAsbi = 350℃和T-GaAs = 550℃的不同温度下生长QWS和本征区域的屏障。使用透射电子显微镜(TEM)的微观结构的研究揭示了无延长缺陷的均匀MQW。此外,使用TEM技术在MQWS区域跨越BI分布谱的局部确定均匀的BI分布,同时揭示引起的BI表面偏析引起的略微化学渐变的GAAS-ON-GAASBI接口。尽管这种小扩大了,但与在Gaasbi / GaAs MQWS的双偏析的先前报告相比,双偏析显着降低(减少了高达18%)。因此,TST过程被证明是一种非常有效的方法来减少双偏析,从而增加层和接口的质量。这些改进肯定地反映了光学性质。使用比以前的报告更少的Bi内容的TST MQW,成功地证明了在1.23μm发射波长的室温光致发光和电致发光(EL)。最后,使用当前TST技术制造的LED在1.0kcm(-2)电流激发下的130mA的喷射电流下,使用本发明的TST技术制造的电流电压(I-V)曲线为3.3V。这些结果不仅证明了TST技术提供了光学器件质量GaAsbi / GaAS MQW,但突出了基于TST的生长技术对基于稀铋的未来异质结构的制造的相关性。

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