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Hydrogen termination of CVD diamond films by high-temperature annealing at atmospheric pressure

机译:大气压下高温退火对CVD金刚石膜的氢终止作用

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摘要

A high-temperature procedure to hydrogenate diamond films using molecular hydrogen at atmospheric pressure was explored. Undoped and doped chemical vapour deposited (CVD) polycrystalline diamond films were treated according to our annealing method using a H_2 gas flow down to ~50 ml/min (STP) at ~850 ℃. The films were extensively evaluated by surface wettability, electron affinity, elemental composition, photoconductivity, and redox studies. In addition, electrografting experiments were performed. The surface characteristics as well as the optoelectronic and redox properties of the annealed films were found to be very similar to hydrogen plasma-treated films. Moreover, the presented method is compatible with atmospheric pressure and provides a low-cost solution to hydrogenate CVD diamond, which makes it interesting for industrial applications. The plausible mechanism for the hydrogen termination of CVD diamond films is based on the formation of surface carbon dangling bonds and carbon-carbon unsaturated bonds at the applied temperature, which react with molecular hydrogen to produce a hydrogen-terminated surface.
机译:探索了在大气压力下使用分子氢将金刚石薄膜氢化的高温工艺。根据我们的退火方法,在〜850℃下使用低至〜50 ml / min(STP)的H_2气流处理未掺杂和掺杂的化学气相沉积(CVD)多晶金刚石薄膜。通过表面润湿性,电子亲和力,元素组成,光电导性和氧化还原研究对薄膜进行了广泛评估。另外,进行了电接枝实验。发现退火膜的表面特性以及光电和氧化还原特性与氢等离子体处理的膜非常相似。此外,所提出的方法与大气压兼容,并提供了一种低成本的方法来氢化CVD金刚石,这使其在工业应用中引起人们的兴趣。 CVD金刚石薄膜氢终止的合理机理是基于在所施加的温度下表面碳悬挂键和碳-碳不饱和键的形成,它们与分子氢反应生成氢封端的表面。

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