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首页> 外文期刊>Scripta materialia >Preparation and characterization of single crystalline anatase TiO2 epitaxial films on LaAlO3(001) substrates by metal organic chemical vapor deposition
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Preparation and characterization of single crystalline anatase TiO2 epitaxial films on LaAlO3(001) substrates by metal organic chemical vapor deposition

机译:金属有机化学气相沉积法在LaAlO3(001)衬底上制备单晶锐钛矿型TiO2外延膜及其表征

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摘要

Anatase phase TiO2 (a-TiO2) films have been fabricated on LaAlO3(001) substrates at the substrate temperatures of 500 to 650 degrees C by the metal organic chemical vapor deposition (MOCVD) method using tetralds-dimethylamino titanium (TDMAT) as the organometallic (OM) source. The structural studies revealed that the TiO2 film prepared at 600 degrees C had the best single crystalline quality with no twins. The out-of-plane and in-plane epitaxial relationships of the films were a-TiO2(004)parallel to LaAlO3(001) and TiO2[100]parallel to LaAlO3[100], respectively. The optical band gap of the films ranged from 3.30 to 3.37 eV. The morphology and composition of the TiO2 films have also been studied in detail. (C) 2016 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.
机译:利用四有机二甲基氨基钛(TDMAT)作为有机金属,通过金属有机化学气相沉积(MOCVD)方法在LaAlO3(001)衬底上以500至650摄氏度的衬底温度制备了锐钛矿相TiO2(a-TiO2)膜。 (OM)源。结构研究表明,在600摄氏度下制备的TiO2薄膜具有最佳的单晶质量,没有孪晶。膜的平面外和平面外延关系分别为平行于LaAlO3(001)的a-TiO2(004)和平行于LaAlO3 [100]的TiO2 [100]。薄膜的光学带隙范围为3.30至3.37 eV。 TiO2薄膜的形貌和组成也已被详细研究。 (C)2016 Acta Materialia Inc.,由Elsevier Ltd.发行。保留所有权利。

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