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Aberration-induced intensity imbalance of alternating phase-shifting mask in lithographic imaging

机译:光刻成像中像差引起的交替相移掩模的强度不平衡

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摘要

We discuss the aberration-induced intensity imbalance of alternating phase-shifting mask (Alt-PSM) in lithographic imaging, in contrast to numerous studies on mask-induced intensity imbalance. Based on the Hopkins theory of partial coherent imaging, a linear relationship between the intensity difference of adjacent peaks in an Alt-PSM image and even aberration is established by formulations and verified by numerical results. The application of the linear relationship is briefly discussed.
机译:我们讨论了光刻成像中交替相移掩模(Alt-PSM)的像差引起的强度不平衡,与掩模引起的强度不平衡的许多研究形成了对比。基于Hopkins部分相干成像理论,通过公式建立了Alt-PSM图像中相邻峰的强度差与均匀像差之间的线性关系,并通过数值结果进行了验证。简要讨论了线性关系的应用。

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