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Photovoltaic properties of GaAsP core-shell nanowires on Si(001) substrate

机译:Si(001)衬底上GaAsP核壳纳米线的光伏性能

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We report on the growth and electro-optical studies of photovoltaic properties of GaAsP nanowires. Low density GaAsP nanowires were grown by Auassisted MOVPE on Si(001) substrates using a two step procedure to form a radial pn junction. The STEM analyses show that the nanowires have cubic structure with the alloy composition GaAs _(0.88)P _(0.12) in the nanowire core and GaAs _(0.76)P _(0.24) in the shell. The nanowire ensembles were processed in the form of sub-millimeter size mesas. The photovoltaic properties were characterized by optical beam induced current (OBIC) and electronic beam induced current (EBIC) maps. Both OBIC and EBIC maps show that the photovoltage is generated by the nanowires; however, a strong signal variation from wire to wire is observed. Only one out of six connected nanowires produce a measurable signal. These strong fluctuations can be tentatively explained by the variation of the resistance of the nanowire-to-substrate connection, which is highly sensitive to the quality of the SiGaAsP interface. This study demonstrates the importance of the spatially resolved charge collection microscopy techniques for the diagnosis of failures in nanowire photovoltaic devices.
机译:我们报告了GaAsP纳米线的光电性能的增长和光电研究。使用两步程序通过Auassisted MOVPE在Si(001)衬底上生长低密度GaAsP纳米线,以形成径向pn结。 STEM分析表明,纳米线具有立方结构,其合金成分在纳米线芯中为GaAs _(0.88)P _(0.12),在壳中为GaAs _(0.76)P _(0.24)。纳米线集合体以亚毫米大小的台面形式加工。通过光束感应电流(OBIC)和电子束感应电流(EBIC)图来表征光伏性能。 OBIC和EBIC图均表明,光电压是由纳米线产生的。但是,观察到导线之间的信号变化很大。六个连接的纳米线中只有一个产生可测量的信号。这些强烈的波动可以通过纳米线与基板之间的电阻变化来初步解释,该变化对SiGaAsP界面的质量高度敏感。这项研究证明了空间分辨电荷收集显微技术对于诊断纳米线光伏器件故障的重要性。

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