首页> 外文期刊>Украинский физический журнал: Науч. журн. >INFLUENCE OF THE CHARGE STATE OF NONEQUILIBBIUM VACANCIESON THE FORMATION AND ANNEALING KINETICS OF RADIATION-INDUCED DEFECTS IN n-Si CRYSTALS
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INFLUENCE OF THE CHARGE STATE OF NONEQUILIBBIUM VACANCIESON THE FORMATION AND ANNEALING KINETICS OF RADIATION-INDUCED DEFECTS IN n-Si CRYSTALS

机译:n-Si晶体中非平衡空泡的电荷状态对辐射诱导缺陷的形成和退火动力学的影响

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摘要

The influence of the charge state of nonequilibrium vacancies on the processes occuring in n-Si crystals during their irradiation and heat treatment has been studied. The n-Si specimens with the electron concentration of 1 X 1013 - 2 x 1014 an"3 prepared by the method of zone melting were studied. The irradiated crystals were investigated by the Hall and the local irradiation methods with subsequent measurements of the bulk photovoltage emerging across the irradiated part of the specimen, The researched specimens were irradiated with 2-MeV electrons or 25-MeV protons at a temperature of 300 K. It has been shown that the nature, energy spectrum, as well as the formation and annealing kinetics of radiation-induced defects in n-Si crystals depend on the charge states of nonequilibrium vacancies, doping impurities, and regions of disordering.
机译:研究了非平衡空位的电荷状态对n-Si晶体辐照和热处理过程的影响。研究了通过区域熔化法制备的电子浓度为1 X 1013-2 x 1014 an“ 3的n-Si标本。通过Hall和局部辐照方法研究了被辐照的晶体,随后测量了整体光电压在300 K的温度下,用2-MeV电子或25-MeV质子辐照所研究的样品。研究表明,样品的性质,能谱以及形成和退火动力学n-Si晶体中由辐射引起的缺陷的数量取决于不平衡空位,掺杂杂质和无序区域的电荷状态。

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