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首页> 外文期刊>Journal of the Optical Society of America, A. Optics, image science, and vision >Analysis of arbitrary defects in photonic crystals by use of the source-model technique
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Analysis of arbitrary defects in photonic crystals by use of the source-model technique

机译:利用源模型技术分析光子晶体中的任意缺陷

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摘要

A novel method derived from the source-model technique is presented to solve the problem of scattering of an electromagnetic plane wave by a two-dimensional photonic crystal slab that contains an arbitrary defect (perturbation). In this method, the electromagnetic fields in the perturbed problem are expressed in terms of the field due to the periodic currents obtained from a solution of the corresponding unperturbed problem plus the field due to yet-to-be-determined correction current sources placed in the vicinity of the perturbation. Appropriate error measures are suggested, and a few representative structures are presented and analyzed to demonstrate the versatility of the proposed method and to provide physical insight into waveguiding and defect coupling mechanisms typical of finite-thickness photonic crystal slabs.
机译:为了解决电磁平面波被包含任意缺陷(扰动)的二维光子晶体平板散射的问题,提出了一种源模型技术衍生的新方法。在这种方法中,扰动问题中的电磁场用场的形式表示,该场是由于从相应的无扰动问题的解中获得的周期性电流加上场强,而场强是由于尚待确定的校正电流源所决定的。摄动附近。提出了适当的误差措施,并提出和分析了一些代表性的结构,以证明所提出方法的多功能性,并为有限厚度光子晶体平板中典型的波导和缺陷耦合机制提供了物理见解。

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