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首页> 外文期刊>Journal of the Korean Physical Society >Electrical Properties of Delta-Doped Silicon-NanowireField-Effect Transistors
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Electrical Properties of Delta-Doped Silicon-NanowireField-Effect Transistors

机译:掺杂Delta的硅纳米线的场效应晶体管的电学性质

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We report on complementary delta-doping (δ-doping) and the electrical transport properties insingle-crystal silicon nanowires (SiNWs) synthesized by using chemical vapor deposition via a vapor-liquid-solid growth process. Self-limited δ-doping layers were formed on intrinsic SiNW surfaceswith either phosphine (PH_3) or diborane (B_2H_6) molecular precursors and were then capped withintrinsic Si shell layers. Gate-dependent transport measurements showed that these δ-doped SiNWsbehaved as either p-type or n-type channels in field-effect transistors (FETs) with transconductancesof 150 nS and 130 nS and carrier mobilities of 45 cm~2/Vs and 40 cm~for p-type n-typeSiNW FETs, respectively.
机译:我们报告了互补δ掺杂(δ掺杂)和通过化学汽相沉积通过气液固相生长过程合成的单晶硅纳米线(SiNWs)的电传输性能。在本征SiNW表面用磷化氢(PH_3)或乙硼烷(B_2H_6)分子前体形成自限δ掺杂层,然后将其封盖在本征Si壳层内。取决于栅极的传输测量结果表明,这些δ掺杂的SiNW在跨导为150 nS和130 nS且载流子迁移率为45 cm〜2 / Vs和40 cm的场效应晶体管(FET)中表现为p型或n型沟道分别用于p型n型SiNW FET。

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