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Low Leakage Current CMOS SRAM

机译:低漏电流CMOS SRAM

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摘要

The growing demands in the multimedia rich applications are motivating the low-power and high-speed circuit designer to work more closely towards the design issues arising from the design trade-offs in power and speed. This paper targets the modeling and simulation of CMOS leakage currents and its minimization approach to reduce the power consumption by a single cell SRAM cache. Utilizing separate bit line and word line during read operation decouples the other cell node from the bit line, hence, enhancing the read static noise margin (SNM) by almost 2 times as compared to the conventional 6T SRAM.
机译:多媒体丰富应用程序中不断增长的需求促使低功耗和高速电路设计人员更加紧密地解决因功率和速度的设计折衷而引起的设计问题。本文针对CMOS泄漏电流的建模和仿真及其最小化方法,以降低单单元SRAM缓存的功耗。在读取操作期间利用分开的位线和字线将另一个单元节点与位线解耦,因此,与常规6T SRAM相比,读取静态噪声容限(SNM)几乎提高了2倍。

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