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首页> 外文期刊>Journal of Semiconductors >SRAM standby leakage decoupling analysis for different leakage reduction techniques
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SRAM standby leakage decoupling analysis for different leakage reduction techniques

机译:用于不同泄漏减少技术的SRAM待机泄漏去耦分析

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摘要

SRAM standby leakage reduction plays a pivotal role in minimizing the power consumption of application processors. Generally, four kinds of techniques are often utilized for SRAM standby leakage reduction: Vdd lowering (VDDL), Vss rising (VSSR), BL floating (BLF) and reversing body bias (RBB). In this paper, we comprehensively analyze and compare the reduction effects of these techniques on different kinds of leakage. It is disclosed that the performance of these techniques depends on the leakage composition of the SRAM cell and temperature. This has been verified on a 65 nm SRAM test macro.
机译:减少SRAM待机泄漏对降低应用处理器的功耗起着至关重要的作用。通常,通常采用四种技术来降低SRAM待机泄漏:降低Vdd(VDDL),提高Vss上升(VSSR),BL浮动(BLF)和反转本体偏置(RBB)。在本文中,我们全面分析和比较了这些技术对不同种类泄漏的减少效果。公开了这些技术的性能取决于SRAM单元的泄漏成分和温度。这已在65 nm SRAM测试宏上得到验证。

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