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Design, analysis and test of high-frequency interconnections in 2.5D package with silicon interposer

机译:具有硅中介层的2.5D封装中的高频互连的设计,分析和测试

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摘要

An interposer test vehicle with TSVs (through-silicon vias) and two redistribute layers (RDLs) on the top side for 2.5D integration was fabricated and high-frequency interconnections were designed in the form of coplanar waveguide (CPW) and micro strip line (MSL) structures. The signal transmission structures were modeled and simulated in a 3D EM tool to estimate the S-parameters. The measurements were carried out using the vector network analyzer (VNA). The simulated results of the transmission lines on the surface of the interposer without TSVs showed good agreement with the simulated results, while the transmission structures with TSVs showed significant offset between simulation and test results. The parameters of the transmission structures were changed, and the results were also presented and discussed in this paper.
机译:制作了一个插入式测试车,该测试车的顶部带有TSV(硅通孔)和两个再分布层(RDL),用于2.5D集成,并设计了共面波导(CPW)和微带线形式的高频互连( MSL)结构。在3D EM工具中对信号传输结构进行建模和仿真,以估计S参数。使用矢量网络分析仪(VNA)进行测量。在没有TSV的中介层表面上的传输线的模拟结果与模​​拟结果显示出良好的一致性,而具有TSV的传输结构在模拟和测试结果之间存在明显的偏移。改变了传输结构的参数,并对结果进行了介绍和讨论。

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