首页> 外文期刊>Journal of Neuroscience Methods >An automated system for measuring tip impedance and among-electrode shunting in high-electrode count microelectrode arrays.
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An automated system for measuring tip impedance and among-electrode shunting in high-electrode count microelectrode arrays.

机译:一种用于测量尖端阻抗和高电极数微电极阵列中电极间分流的自动化系统。

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The development and effective use of robust high-electrode-count microelectrode arrays for neuronal recording and stimulation depends on effective monitoring of electrode impedances and how these change over time. In multielectrode arrays, conventional electrode impedance measurements may be confounded by possible shunting of signals among electrodes. Additionally, most present methods to monitor impedances in high-electrode-count arrays are labor intensive, requiring manual testing of one individual electrode at a time. We have developed a system capable of automatically measuring the impedances of each microelectrode on a 100-microelectrode array with a 1-kHz, 10-mV sine wave. Through switching logic, two impedance values are measured for each electrode in an array: (1) the unshunted impedance (presumably representing the actual tip impedance); and (2) the shunted impedance. These two measurements are used to calculate the net impedance of leakage/shunting pathways from the test electrode through allthe other electrodes in the array. The system measures impedances in the range of 300 Omega-10 MOmega. The system was validated with simple resistor ladder networks, and measurements of the modeled electrode tip impedances were within 2% of independently measured values. Additionally, the system reliably indicated the relative values of the net shunting impedances, although high values were systematically underestimated. The automated device was capable of measuring electrode tip and net shunting impedance values for a 100-microelectrode array in 5 min. These rapid and repeatable measurements allow for the quantitative assessment of high-electrode-count arrays over time.
机译:健壮的高电极数微电极阵列在神经元记录和刺激中的开发和有效使用取决于对电极阻抗的有效监控以及这些阻抗如何随时间变化。在多电极阵列中,常规的电极阻抗测量可能会因电极之间可能的信号分流而混淆。此外,目前监测高电极数阵列中阻抗的大多数方法都需要大量劳动,需要一次手动测试一个电极。我们已经开发出了一种系统,该系统能够以1 kHz,10 mV正弦波自动测量100微电极阵列上每个微电极的阻抗。通过切换逻辑,为阵列中的每个电极测量两个阻抗值:(1)非并联阻抗(大概代表实际尖端阻抗); (2)并联阻抗。这两个测量值用于计算从测试电极到阵列中所有其他电极的泄漏/旁路路径的净阻抗。该系统测量的阻抗范围为300 Omega-10 MOmega。该系统已通过简单的电阻梯形网络进行了验证,并且建模电极尖端阻抗的测量值在独立测量值的2%以内。此外,系统会可靠地指示净分流阻抗的相对值,尽管系统会低估高值。该自动化设备能够在5分钟内测量100个微电极阵列的电极头和净分流阻抗值。这些快速且可重复的测量值可用于随时间推移对高电极数阵列进行定量评估。

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