首页> 外文学位 >An automated system for measuring tip impedance and among-electrode shunting in high-density microelectrode arrays.
【24h】

An automated system for measuring tip impedance and among-electrode shunting in high-density microelectrode arrays.

机译:用于测量尖端阻抗和高密度微电极阵列中电极间分流的自动化系统。

获取原文
获取原文并翻译 | 示例

摘要

Microelectrode arrays are being routinely used today as a means to better understand and interface with the nervous system, in order to develop prostheses that can restore function in systems that do not function properly. The development and effective use of robust high-channel-count microelectrode arrays for neuronal recording and stimulation depends on effective monitoring of electrode impedances and how these change over time. For multielectrode arrays, conventional electrode impedance measurements may be confounded by possible shunting of signals among electrodes. Additionally, most present methods to monitor impedances in high-electrode-count arrays are labor intensive, requiring manual testing of one individual electrode at a time. The research effort described herein included the development of a system capable of automatically measuring the impedances of each microelectrode on a 100-microelectrode array with a 1-kHz, 10-mV sine wave. Through switching logic, two impedance values are measured for each electrode in an array: (1) the unshunted impedance (presumably representing the actual tip impedance) and (2) the shunted impedance. These two measurements are used to calculate the net impedance of leakage/shunting pathways from the test electrode through all the other electrodes in the array. The system measures impedances in the range of 300 O to 10 MO. The system was validated with simple resistor ladder networks, and measurements of the modeled electrode tip impedances were within 2% of independently measured values. Additionally, the system reliably indicated the relative values of the net shunting impedances, although high values were systematically underestimated. The automated device is capable of measuring electrode tip and net shunting impedance values for a 100-microelectrode array in 5 minutes. These rapid and repeatable measurements allow for the quantitative assessment of high electrode count arrays over time.
机译:如今,微电极阵列通常被用作更好地了解神经系统并与之互动的一种手段,以开发可在功能不正常的系统中恢复功能的假体。健壮的高通道数微电极阵列用于神经元记录和刺激的开发和有效使用取决于对电极阻抗的有效监控以及这些阻抗随时间的变化。对于多电极阵列,常规的电极阻抗测量可能会因电极之间可能的信号分流而混淆。另外,大多数当前的监视高电极数阵列中阻抗的方法都是劳动密集型的,需要一次手动测试一个单独的电极。本文所述的研究工作包括开发一种系统,该系统能够以1 kHz,10 mV正弦波自动测量100微电极阵列上每个微电极的阻抗。通过切换逻辑,为阵列中的每个电极测量两个阻抗值:(1)未并联的阻抗(大概代表实际的尖端阻抗)和(2)并联的阻抗。这两个测量值用于计算从测试电极到阵列中所有其他电极的泄漏/旁路路径的净阻抗。系统测量的阻抗范围为300 O至10 MO。该系统已通过简单的梯形电阻网络进行了验证,建模电极尖端阻抗的测量值在独立测量值的2%以内。此外,系统会可靠地指示净分流阻抗的相对值,尽管系统会低估较高的值。自动化设备能够在5分钟内测量100个微电极阵列的电极头和净分流阻抗值。这些快速且可重复的测量值可用于随时间推移对高电极数阵列进行定量评估。

著录项

  • 作者

    Gunalan, Kabilar.;

  • 作者单位

    The University of Utah.;

  • 授予单位 The University of Utah.;
  • 学科 Engineering Biomedical.
  • 学位 M.S.
  • 年度 2010
  • 页码 95 p.
  • 总页数 95
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号