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Size-dependent pull-in instability of electrostatically actuated microbeam-based MEMS

机译:静电驱动的基于微束的MEMS的尺寸依赖性插入不稳定性

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摘要

We present a size-dependent model for electrostatically actuated microbeam-based MEMS using strain gradient elasticity theory. The normalized pull-in voltage is shown to increase nonlinearly with the decrease of the beam height, and the size effect becomes prominent if the beam thickness is on the order of microns or smaller (i.e. when the beam dimension is comparable to the material length scale parameter). Very good agreement is found between the present model and available experimental data. The study may be helpful to characterize the mechanical properties of small size MEMS, or guide the design of microbeam-based devices for a wide range of potential applications.
机译:我们使用应变梯度弹性理论为基于静电的基于微束的MEMS提出了尺寸依赖模型。示出了归一化的引入电压随着束高度的减小而非线性地增加,并且如果束厚度为微米或更小量级(即,当束尺寸与材料长度尺度相当时),尺寸效应变得显着。参数)。在当前模型和可用的实验数据之间找到了很好的一致性。这项研究可能有助于表征小型MEMS的机械性能,或指导针对广泛潜在应用的基于微束的器件的设计。

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