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首页> 外文期刊>Journal of Micromechanics and Microengineering >PLANARIZATION AND FABRICATION OF BRIDGES ACROSS DEEP GROOVES OR HOLES IN SILICON USING A DRY FILM PHOTORESIST FOLLOWED BY AN ETCH BACK
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PLANARIZATION AND FABRICATION OF BRIDGES ACROSS DEEP GROOVES OR HOLES IN SILICON USING A DRY FILM PHOTORESIST FOLLOWED BY AN ETCH BACK

机译:硅片上沿深沟槽或孔的平面化和制造,其后使用后退的干膜光致抗蚀剂

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摘要

A technique is presented that provides planarization after a very deep etching step in silicon. This offers the possibility for not only resist spinning and layer patterning but also for realization of bridges and cantilevers across deep grooves or holes. The technique contains a standard dry film lamination step to cover a wafer with a 38 mu m thick foil. Next the foil is etched back to the desired thickness of a few micrometres. This thin film facilitates resist spinning and high-resolution patterning. The planarization method is demonstrated by the fabrication of aluminium bridges across a deep groove in silicon. [References: 8]
机译:提出了一种在非常深的硅蚀刻步骤后提供平坦化的技术。这不仅提供了抵抗旋转和层构图的可能性,而且还提供了实现跨越深沟槽或孔的桥和悬臂的可能性。该技术包含标准的干膜层压步骤,以覆盖38微米厚的箔片。接下来,将箔蚀刻回几微米的所需厚度。该薄膜有助于抗蚀剂旋转和高分辨率图案化。通过在硅的深槽上制造铝桥来证明平面化方法。 [参考:8]

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