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Study of hydrogenated nanoamorphous silicon(na-Si : H) thin film prepared by RF magnetron sputtering for graded optical band gap (E-g(opt))

机译:射频磁控溅射制备梯度纳米带隙(E-g(opt))的氢化纳米非晶硅(na-Si:H)薄膜的研究

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摘要

The schematic of the energy band gap figure of the graded optical band gap (E-g(opt)) in p-i-n layer in na-Si: H solar cells was given in the paper. The intrinsic hydrogenated nanoamorphous silicon( na-Si: H) thin films with the graded band gap as a function of depth through the films were prepared by varying the processing power, gas pressure, gas composition, and etc., We have carried out a investigation of the relationships between the E-g(opt) with the crystallization ratio (Xc) and the E-g(opt) with the nanocrystalline grain size ( D) in na-Si: H thin films grown by PECVD on glass substrates through XRD, Raman scattering, transmission. The E-g(opt) increase with the decreases of the crystallization ratio (Xc) and the nanocrystalline grain size ( D). The hydrogen dilution ratio is found to increase basically both the crystallization ratio ( Xc) and the nanocrystalline grain size ( D). Two relationships in na-Si: H are discussed by the etching effect of atomic hydrogen in the framework of the growth mechanism and the quantum size effect (QSE). (C) 2005 Springer Science + Business Media, Inc.
机译:给出了Na-Si:H太阳能电池p-i-n层中渐变光学带隙(E-g(opt))的能带隙图。通过改变处理能力,气压,气体成分等,制备了本征氢化的纳米非晶硅(na-Si:H)薄膜,其带隙梯度随薄膜的深度而变化。 X射线衍射,拉曼散射在玻璃基板上通过PECVD在玻璃衬底上生长的na-Si:H薄膜中,结晶度(Xc)的Eg(opt)和纳米晶粒尺寸(D)的Eg(opt)之间的关系的研究, 传播。 E-g(opt)随着结晶率(Xc)和纳米晶粒尺寸(D)的减小而增加。发现氢稀释率基本上增加了结晶率(Xc)和纳米晶粒尺寸(D)。通过生长机理和量子尺寸效应(QSE)框架中原子氢的蚀刻效应,讨论了Na-Si:H中的两个关系。 (C)2005年Springer Science + Business Media,Inc.

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