首页> 外国专利> FILM FORMED BY OPTICAL THIN FILM FOR HIGH PERFORMANCE VACUUM ULTRAVIOLET WAVELENGTH RANGE BY REACTIVE DC MAGNETRON SPUTTERING METHOD

FILM FORMED BY OPTICAL THIN FILM FOR HIGH PERFORMANCE VACUUM ULTRAVIOLET WAVELENGTH RANGE BY REACTIVE DC MAGNETRON SPUTTERING METHOD

机译:有源直流磁控溅射法制备高性能真空紫外波长范围的光学薄膜

摘要

PROBLEM TO BE SOLVED: To reduce an absorption scattered in an interface between a film and a substrate when a fluoride optical thin film for a vacuum ultraviolet wavelength range to a fluoride substrate is formed by reactive DC sputtering. ;SOLUTION: The optical thin film deals with a high performance vacuum ultraviolet wavelength range, and can be formed by removing an absorption factor scattered in an interface between the film and the substrate such as an organic material or the like on the surface of the substrate. A cleaning step of the substrate is filled in-situ before a film forming step in a vacuum film forming chamber of a reactive DC magnetron sputtering apparatus. In this apparatus, a gas having a cleaning effect or a reactive gas at a film forming time is separated and can be introduced, and effects of stability of discharging, suppressing of a damage of a plasma can be performed.;COPYRIGHT: (C)2004,JPO
机译:解决的问题:当通过反应性DC溅射形成对于氟化物基板具有真空紫外波长范围的氟化物光学薄膜时,减少在膜与基板之间的界面中散射的吸收。 ;解决方案:光学薄膜具有高性能的真空紫外线波长范围,可以通过除去分散在薄膜与基板之间的界面上的吸收因子(例如基板表面上的有机材料等)来形成。在反应DC磁控溅射设备的真空成膜室中的成膜步骤之前,就地填充基板的清洁步骤。在该装置中,可以分离并引入具有清洁效果的气体或在成膜时的反应性气体,并且可以执行放电稳定性,抑制等离子体损坏的效果。版权所有:(C) 2004年

著录项

  • 公开/公告号JP2003344606A

    专利类型

  • 公开/公告日2003-12-03

    原文格式PDF

  • 申请/专利权人 CANON INC;

    申请/专利号JP20020155755

  • 发明设计人 YAZAKI YOICHI;

    申请日2002-05-29

  • 分类号G02B1/11;C23C14/06;C23C14/35;

  • 国家 JP

  • 入库时间 2022-08-21 23:23:08

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