首页> 外文期刊>Journal of Electronic Materials >A Low-Temperature Bonding Process Using Mixed Cu-Ag Nanoparticles
【24h】

A Low-Temperature Bonding Process Using Mixed Cu-Ag Nanoparticles

机译:使用混合Cu-Ag纳米粒子的低温键合工艺

获取原文
获取原文并翻译 | 示例
           

摘要

A low-temperature bonding process to form joints with high strength and ionic migration resistance using mixed Cu-Ag nanoparticles was studied. Although it was difficult to obtain strong joints using Cu nanoparticles, with the addition of Ag nanoparticles to the Cu nanoparticles the bonding strength of the Cu-to-Cu joints increased. The joints formed by the mixed Cu-Ag nanoparticles at 350 deg C exhibited a high bonding strength of approx50 MPa. Counterelectrodes made of the mixed Cu-Ag nanoparticles had four times higher ionic migration resistance compared with counterelectrodes made only of Ag nanoparticles.
机译:研究了使用混合的Cu-Ag纳米粒子的低温粘结工艺,以形成具有高强度和抗离子迁移性的接头。尽管使用铜纳米颗粒很难获得牢固的接头,但是通过向铜纳米颗粒中添加银纳米颗粒,铜对铜接头的结合强度得以提高。由混合的Cu-Ag纳米颗粒在350摄氏度形成的接头表现出约50 MPa的高粘结强度。由混合的Cu-Ag纳米粒子制成的对电极的离子迁移阻力是仅由Ag纳米粒子制成的对电极的四倍。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号