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A Study of Plasma-Cleaned Ag-Plated Cu Leadframe Surfaces

机译:等离子体清洗的镀银铜引线框架表面的研究

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In this study, an Ar plasma was employed to remove the antitarnish layer on Ag-plated Cu leadframe surfaces using various process powers and times. Measurements of the contact angle, field-emission scanning electron microscopy, x-ray photoelectron spectroscopy, and time-of-flight secondary-ion mass spectrometry were employed to characterize both the Ag and Cu surfaces before and after plasma cleaning. The antitarnish layer on the leadframe surfaces was determined to be benzotriazole and/or its derivatives. Low-power and short-duration plasma treatments did not significantly change the Ag and Cu surfaces in terms of their surface morphologies, and such treatments were not able to totally remove the antitarnish layer. In contrast, a high-power and long-duration plasma treatment made the surfaces slightly smoother and was able to remove the antitarnish layer on both Ag and Cu surfaces. However, cross-contaminations were also detected between the Ag and Cu surfaces during the plasma cleaning process. This cross-contamination is due to redeposition of Ag and Cu atoms during the plasma treatment.
机译:在这项研究中,使用Ar等离子体以各种工艺功率和时间去除镀银的Cu引线框表面上的防锈层。接触角的测量,场发射扫描电子显微镜,x射线光电子能谱和飞行时间二次离子质谱法用于表征等离子体清洗前后的Ag和Cu表面。确定引线框架表面上的防锈层为苯并三唑和/或其衍生物。就其表面形态而言,低功率和短时间的等离子体处理并未显着改变Ag和Cu表面,并且此类处理无法完全去除防锈层。相反,高功率和长时间的等离子体处理使表面略微光滑,并且能够去除Ag和Cu表面上的防锈层。但是,在等离子体清洁过程中,还发现了Ag和Cu表面之间的交叉污染。这种交叉污染是由于在等离子体处理过程中重新沉积了Ag和Cu原子。

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