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Study on the Microstructre of a Novel Lead-Free Solder Alloy SnAgCu-RE and Its Soldered Joints

机译:新型无铅锡​​合金SnAgCu-RE及其焊接接头的显微组织研究

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This paper focused on the microstructure of SnAgCu-rare earth (RE) solder alloy and its small single-lap joints, focusing on phases present and the distribution of RE in the SnAgCu solder. Energy dispersive x-ray (EDX) analysis was used to observed the RE-rich phase. The RE atoms also tended to aggregate at boundaries of primary dendrites in the joints and form as a weblike structure, which surrounded the dendrites and restrained the dendrites from sliding or moving. It is assumed that this would strengthen the boundaries and increase the resistance to creep deformation of the solder matrix. The creep-rupture life of joints can be remarkably increased, at least seven times more than that of SnAgCu at room temperature The aggregation mechanism of RE at dendrite boundaries in SnAgCu solder joints was presented. The drive for RE atoms to aggregate at the boundary is the difference of the lattice-aberration energy between the interior and the boundaries of the dendrites, which is caused by a solution of RE atoms.
机译:本文重点研究了SnAgCu稀土(RE)焊料合金的微观结构及其小的单搭接接头,重点研究了SnAgCu焊料中RE的存在相和分布。能量色散X射线(EDX)分析用于观察富RE相。 RE原子还趋于聚集在关节中的主要树枝状晶体的边界处,并形成为网状结构,其包围树枝状晶体并抑制树枝状晶体滑动或移动。假定这将加强边界并增加对焊料基体的蠕变变形的抵抗力。在室温下,接头的蠕变断裂寿命可以显着提高,至少是SnAgCu的7倍。提出了SnAgCu焊点在树枝状晶界处RE的聚集机制。 RE原子在边界处聚集的驱动力是内部和树枝晶边界之间的晶格像差能差,这是由RE原子的溶液引起的。

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