...
首页> 外文期刊>Journal of active and passive electronic devices >Analysis of Different SRAM Cell Topologies and Design of 10T SRAM Cell with Improved Read Speed
【24h】

Analysis of Different SRAM Cell Topologies and Design of 10T SRAM Cell with Improved Read Speed

机译:分析不同SRAM单元拓扑和提高读取速度的10T SRAM单元设计

获取原文
获取原文并翻译 | 示例
   

获取外文期刊封面封底 >>

       

摘要

The aim of this paper is to analyze the read behaviour of the multiple SRAM cell structures using cadence tool at45nm technology and to compare the cells for read operation while keeping the read and write access time and the supply voltage as low as possible. In particular, the leakage currents, leakage power and read behaviour of each SRAM cells are examined. A 10T SRAM cell implementation is proposed here that results in reduced leakage power and leakage current, at the same time with increased read stability in comparision with the conventional 6T SRAM cell as well as 7T, 8T and 9T SRAM cells. As a result, the 10T SRAM always consumes lowest leakage power and leakage current; improve read stability as compared to the 6T, 7T, 8T and 9T SRAM cells.
机译:本文的目的是使用45nm技术的节奏工具分析多个SRAM单元结构的读取行为,并比较这些单元的读取操作,同时保持读取和写入访问时间以及电源电压尽可能低。特别地,检查每个SRAM单元的泄漏电流,泄漏功率和读取行为。在此提出了一种10T SRAM单元实现方案,与传统的6T SRAM单元以及7T,8T和9T SRAM单元相比,它可以降低泄漏功率和泄漏电流,同时提高读取稳定性。结果,10T SRAM始终消耗最低的泄漏功率和泄漏电流。与6T,7T,8T和9T SRAM单元相比,可提高读取稳定性。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号