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Control wettability of the hydrogen-terminated diamond surface and the oxidized diamond surface using an atomic force microscope

机译:使用原子力显微镜控制氢封端金刚石表面和氧化金刚石表面的润湿性

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The force-distance curve indicates the difference in wettability between the hydrogen-terminated (H-terminated) diamond surface and the AFM-field-assisted local oxidized (O-terminated) area. Using a hydrophilic (silicon with native oxide) tip and a hydrophobic (coated with gold) tip as AFM tips, the adhesion force mapping measurement shows that the H-terminated surface is hydrophobic and that the O-terminated surface is hydrophilic. After heating in vacuum, the difference in the adhesion force between two surfaces decreased.This means that water adsorbed on the tip and sample surfaces affects the adhesion force. As an alternative measurement, the contact angle measurement of the H-terminated surface and the chemically oxidized surface was performed. It is proved that the oxidized surface is more hydrophiblic than the H-terminated surface and that its surface energy is derived from surface polarity such as that involved in hydrogen bonding and electric dipole which is twofold that the H-terminated surface.
机译:力-距离曲线表示氢封端(H端)金刚石表面与AFM场辅助局部氧化(O端)区域之间的润湿性差异。使用亲水性(带有天然氧化物的硅)尖端和疏水性(涂有金的尖端)作为AFM尖端,粘附力映射测量显示H端接的表面是疏水的,O端接的表面是亲水的。真空加热后,两个表面之间的粘附力差异减小,这意味着吸附在尖端和样品表面上的水会影响粘附力。作为替代性测量,进行了H末端表面和化学氧化表面的接触角测量。可以证明,氧化的表面比氢封端的表面更具疏水性,其表面能来自表面极性,例如氢键和电偶极所涉及的极性,是氢封端表面的两倍。

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