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首页> 外文期刊>Physical review >Atomic-resolution imaging of clean and hydrogen-terminated C(100)-(2×l) diamond surfaces using noncontact AFM
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Atomic-resolution imaging of clean and hydrogen-terminated C(100)-(2×l) diamond surfaces using noncontact AFM

机译:使用非接触式AFM清洁和氢终止的C(100)-(2×l)金刚石表面的原子分辨率成像

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摘要

High-purity, type Ⅱa diamond is investigated by noncontact atomic force microscopy (NC-AFM). We present atomic-resolution images of both the electrically conducting hydrogen-terminated C(100)-(2× 1):H surface and the insulating C(100)-(2× 1) surface. For the hydrogen-terminated surface, a nearly square unit cell is imaged. In contrast to previous scanning tunneling microscopy experiments, NC-AFM imaging allows both hydrogen atoms within the unit cell to be resolved individually, indicating a symmetric dimer alignment. Upon removing the surface hydrogen, the diamond sample becomes insulating. We present atomic-resolution images, revealing individual C-C dimers. Our results provide real-space experimental evidence for a (2 × 1) dimer reconstruction of the truly insulating C(100) surface.
机译:通过非接触原子力显微镜(NC-AFM)研究了高纯度Ⅱa型钻石。我们提出了导电的氢封端的C(100)-(2×1):H表面和绝缘的C(100)-(2×1)表面的原子分辨率图像。对于氢封端的表面,成像了一个近似正方形的晶胞。与以前的扫描隧道显微镜实验相反,NC-AFM成像可以使晶胞内的两个氢原子单独分解,表明对称的二聚体排列。除去表面氢后,金刚石样品将变为绝缘的。我们提出了原子分辨率图像,揭示了各个C-C二聚体。我们的结果为真正绝缘的C(100)表面的(2×1)二聚体重建提供了真实空间的实验证据。

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  • 来源
    《Physical review》 |2010年第20期|P.201403.1-201403.4|共4页
  • 作者单位

    Institut fuer Physikalische Chemie, Fachbereich Chemie, Johannes Gutenberg-Universitaet Mainz,Jakob-Welder-Weg 11, 55099 Mainz, Germany;

    rnInstitut fuer Physikalische Chemie, Fachbereich Chemie, Johannes Gutenberg-Universitaet Mainz,Jakob-Welder-Weg 11, 55099 Mainz, Germany;

    rnInstitut fuer Physikalische Chemie, Fachbereich Chemie, Johannes Gutenberg-Universitaet Mainz,Jakob-Welder-Weg 11, 55099 Mainz, Germany;

    rnLaboratoire de Photophysique Moleculaire, Universite Paris-Sud, Batiment 210, 91405 Orsay Cedex, France;

    rnLaboratoire de Photophysique Moleculaire, Universite Paris-Sud, Batiment 210, 91405 Orsay Cedex, France;

    rnFachbereich Physik, Universitaet Osnabrueck, Barbarastrasse 7, 49076 Osnabrueck, Germany;

    rnFachbereich Physik, Universitaet Osnabrueck, Barbarastrasse 7, 49076 Osnabrueck, Germany;

    rnInstitut fuer Experimentalphysik, Freie Universitaet Berlin, Arnimallee 14, 14195 Berlin, Germany;

    rnInstitut fuer Physikalische Chemie, Fachbereich Chemie, Johannes Gutenberg-Universitaet Mainz,Jakob-Welder-Weg 11, 55099 Mainz, Germany;

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  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    atomic force microscopy (AFM); elemental solids;

    机译:原子力显微镜(AFM);元素固体;

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