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首页> 外文期刊>Diamond and Related Materials >Measurement of charge carrier's transportation in a large size self-standing CVD single crystal diamond film fabricated using lift-off method
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Measurement of charge carrier's transportation in a large size self-standing CVD single crystal diamond film fabricated using lift-off method

机译:使用剥离法制造的大型自立式CVD单晶金刚石薄膜中载流子传输的测量

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摘要

Using lift-off method, we synthesized large self-standing plasma CVD diamond films on various substrates. Charge carrier transportation in diamond was measured using a particle measurements and TOF methods with a short-pulsed UV laser. The high-quality films were synthesized rapidly. We observed the maximum transit time of holes and electrons shorter than 5 ns. The lift-off method is useful to fabricate the high-quality diamond with excellent drift velocities of the charge carrier. The charge transport characteristics of our diamond films are comparable to those of a commercially available (Element Six Ltd.) electronics grade IIa diamond single crystal.
机译:使用剥离方法,我们在各种基板上合成了大型自立式等离子CVD金刚石膜。使用粒子测量和TOF方法以及短脉冲UV激光测量金刚石中的电荷载流子传输。快速合成了高质量的薄膜。我们观察到空穴和电子的最大传输时间短于5 ns。剥离方法可用于制造电荷载流子漂移速度极高的高质量金刚石。我们的金刚石膜的电荷传输特性可与市售(Element Six Ltd.)电子级IIa金刚石单晶媲美。

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