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Photodetectors with CVD diamond films: electrical and photoelectrical properties photoconductive and photodiode structures

机译:带有CVD金刚石膜的光电探测器:光电性能,光电导和光电二极管结构

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摘要

Free-standing and silicon-supported diamond films have been used to fabricate photoconductiveand photodiode structures for UV light detection. Planar and sandwiched photoconductive structureshave been made on microwave plasma-grown free-standing CVD polycrystalline diamond films of200 μm and 15 μm thicknesses, respectively. A photodiode sandwich structure was obtained onthin (~2 μm) boron-doped diamond films grown on silicon substrate by hot filament CVD.Parameters of defects in the structures were studied by charge-based deep-level transientspectroscopy (Q-DLTS). Planar photoconductive detectors after annealing in air showed a low dark current <10 pA anda high spectral discrimination a l0{sup}4 higher response to 200 nm than to visible (600 nm)wavelengths. The dark current was <10 pA. The turn-off time of the device following exposure tolight was less then 10 ms. It was found that the annealing in air decreases density of point defectsmore than order and strongly increases wavelength discrimination. The sandwich photodiodesshowed a sharp cut-off in photoresponse at 220 nm with a quantum yield of about 0.3 and aphotovoltage in the open circuit regime of up to 1.6 V. Such photodiodes can be used not only for lightdetection but also for light energy transformation into electrical energy as in a photovoltaic cell.
机译:自支撑和硅支撑的金刚石膜已被用于制造用于紫外线检测的光电导和光电二极管结构。分别在厚度为200μm和15μm的微波等离子体生长的自立式CVD多晶金刚石薄膜上制作了平面和三明治式光电导结构。通过热丝CVD法在硅衬底上生长的薄(〜2μm)掺硼金刚石薄膜上获得了光电二极管三明治结构。通过电荷基深能级瞬变光谱法(Q-DLTS)研究了结构中的缺陷参数。在空气中退火后的平面光电导检测器显示出<10 pA的低暗电流和高光谱辨别力,对200 nm的响应比对可见(600 nm)波长的响应高10。暗电流小于10 pA。曝光后设备的关闭时间少于10 ms。发现在空气中进行的退火使点缺陷的密度降低的程度超过数量级,并大大增加了波长分辨力。夹层光电二极管在220 nm处显示出光响应的急剧截止,量子产率约为0.3,并且在开路状态下的光电压高达1.6V。此类光电二极管不仅可以用于光检测,还可以用于将光能转换为电能。像光伏电池一样的能量。

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