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Composition and optoelectrical properties of sputtering MoSex films

机译:溅射MoSex膜的组成和光电性能

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摘要

Influence of sputtering pressure on composition, optical and electrical properties of amorphous MoSex films has been systematically investigated. The highest Se concentration and nearly stoichiometric ratio Se/Mo in MoSex films were observed at a sputtering pressure of 0.3 Pa. When the sputtering pressure is increased, the binding energies of Mo 3d and Se 3d peaks of the MoSex films increase, the blue shift of optical transmission edge is observed and the optical band gap decreases from 0.92 to 0.78 eV. Additionally, Hall mobility decreases first and then increases slightly, the resistivity of the films decreases, whereas the carrier concentration of the films increases with an increase in sputtering pressure. The MoSex films deposited at 0.3 Pa have larger Hall mobility (6.45 cm(2) V-1 s(-1)) and higher optical band gap (0.92 eV) because of lower Se vacancy defect concentration.
机译:已经系统地研究了溅射压力对非晶MoSex膜的组成,光学和电学性质的影响。在0.3 Pa的溅射压力下观察到MoSex膜中的最高Se浓度和接近化学计量比的Se / Mo。当溅射压力增加时,MoSex膜的Mo 3d和Se 3d峰的结合能增加,蓝移观察到光传输边缘的角度θ,光带隙从0.92eV减小到0.78eV。另外,霍尔迁移率首先降低,然后略微增加,薄膜的电阻率降低,而薄膜的载流子浓度随着溅射压力的增加而增加。 MoSex薄膜在0.3 Pa处沉积,因为较低的Se空位缺陷浓度而具有更大的霍尔迁移率(6.45 cm(2)V-1 s(-1))和更高的光学带隙(0.92 eV)。

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