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首页> 外文期刊>Surface and Interface Analysis: SIA: An International Journal Devoted to the Development and Application of Techniques for the Analysis of Surfaces, Interfaces and Thin Films >Luminescence properties of Cu-ion-implanted and annealed ZnO thin films deposited by chemical vapor deposition and pulsed laser deposition
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Luminescence properties of Cu-ion-implanted and annealed ZnO thin films deposited by chemical vapor deposition and pulsed laser deposition

机译:化学气相沉积和脉冲激光沉积Cu离子注入退火ZnO薄膜的发光特性

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摘要

Ion implantation techniques were used to study the effect of an MgO additive on the luminescence properties induced by Cu in ZnO thin films. Cu ions (accelerating voltage of 75 keV, dose of 4.5 x 10(14) ions/cm(2)) were implanted at room temperature in nondoped and Mg-doped ZnO thin films. After annealing, emissions in the visible region originating from Cu phosphor were observed at 510 run in CVD-ZnO and at 450 nm in Mg-doped ZnO (MZO) thin films. The Cu depth profile shows distortion in the low-concentration region of CVD-ZnO. After the annealing, the Cu implant was homogenized in thin films, and then the Cu concentration was determined to be 1.5 x 10(19) ions/cm(3) in CVD-ZnO and 5.6 x 10(18) ions/cm(3) in MZO thin films. Copyright (C) 2005 John Wiley & Sons, Ltd.
机译:离子注入技术用于研究MgO添加剂对ZnO薄膜中Cu诱导的发光性能的影响。在室温下将Cu离子(加速电压为75 keV,剂量为4.5 x 10(14)离子/ cm(2))注入到非掺杂和Mg掺杂的ZnO薄膜中。退火后,在510nm的CVD-ZnO中和在450nm的掺Mg的ZnO(MZO)薄膜中观察到了源自铜磷光体的可见光区域的发射。 Cu深度分布显示出在CVD-ZnO的低浓度区域中的变形。退火后,将Cu注入物均匀化成薄膜,然后确定CVD-ZnO中的Cu浓度为1.5 x 10(19)离子/ cm(3)和5.6 x 10(18)离子/ cm(3) )在MZO薄膜中。版权所有(C)2005 John Wiley&Sons,Ltd.

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