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首页> 外文期刊>Surface & Coatings Technology >Discharge diagnosis and controlled deposition of SnO{sub}x:F films by DC-reactive sputtering from a metallic tin target
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Discharge diagnosis and controlled deposition of SnO{sub}x:F films by DC-reactive sputtering from a metallic tin target

机译:通过直流反应溅射从金属锡靶上诊断放电并控制SnO {sub} x:F膜的沉积

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Fluorine-doped tin oxide (SnO{sub}x:F) films on glass substrates have been prepared by reactive magnetron DC-sputtering in Ar-O{sub}2-Freon plasma from a metallic tin target. We studied the relationship between the discharge characteristics and film properties and found the discharge conditions in which the films belong to the SnO{sub}2 or to the SnO stoichiometry, by proposing a phase diagram for this system. We showed that the film stoichiometry is closely related to the tin valence changes at the target. We found that there is a narrow voltage band and a limit value in the oxygen content where the films have SnO{sub}2 stoichiometry; outside this region SnO films are obtained. We studied the crystallinity and the optical properties of the SnO{sub}2 films. The result show that crystalline films have cassiterite-like diffraction patterns with preferred orientation in the (110) planes. The crystallinity of the films is improved when the discharge voltage and oxygen content increase. A thermal annealing of the amorphous films at 500℃ leaves them in the crystalline cassiterite-like form. The films have a transmittance of ~80% in the visible region of the spectrum and a uniform thickness.
机译:通过在金属锡靶的Ar-O {sub} 2-Freon等离子体中进行反应性磁控管直流溅射,已经制备了玻璃基板上的掺氟氧化锡(SnO {sub} x:F)薄膜。我们通过提出该系统的相图,研究了放电特性与薄膜性能之间的关系,并发现了薄膜属于SnO {sub} 2或SnO化学计量的薄膜的放电条件。我们表明,薄膜化学计量与靶标上的锡价变化密切相关。我们发现,当薄膜的化学计量比为SnO {sub} 2时,氧含量存在一个狭窄的电压带和一个极限值。在该区域之外获得SnO膜。我们研究了SnO {sub} 2薄膜的结晶度和光学性质。结果表明,结晶膜具有锡石状衍射图样,在(110)平面中具有较好的取向。当放电电压和氧含量增加时,膜的结晶度提高。在500℃下对非晶膜进行热退火,使它们呈晶状锡石状。这些薄膜在光谱的可见光区域具有约80%的透射率,并且厚度均匀。

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